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2021 IEEE International Reliability Physics Symposium (IRPS) ,
5
The properties, effect and extraction of localized defect p..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
7
The Influence of Gate Bias on the Anneal of Hot-Carrier Deg..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
8
A Compact Physics Analytical Model for Hot-Carrier Degradat..:
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2020 IEEE International Integrated Reliability Workshop (IIRW) ,
10
Modeling the Hysteresis of Current-Voltage Characteristics ..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
12
A physics-aware compact modeling framework for transistor a..:
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2019 IEEE International Integrated Reliability Workshop (IIRW) ,
13