UEMORI, Satoshi
17  Ergebnisse:
Personensuche X
?
 
?
2

Design for Testability That Reduces Linearity Testing Time ..:

OGAWA, Tomohiko ; KOBAYASHI, Haruo ; UEMORI, Satoshi...
IEICE Transactions on Electronics.  E94-C (2011)  6 - p. 1061-1064 , 2011
 
?
3

Background Self-Calibration Algorithm for Pipelined ADC Usi..:

YAGI, Takuya ; USUI, Kunihiko ; MATSUURA, Tatsuji...
IEICE Transactions on Electronics.  E94-C (2011)  7 - p. 1233-1236 , 2011
 
?
4

Production Test Considerations for Mixed‐signal IC with Bac..:

Yagi, Takuya ; Kobayashi, Haruo ; Tan, Yohei...
IEEJ Transactions on Electrical and Electronic Engineering.  5 (2010)  6 - p. 627-631 , 2010
 
?
 
?
8

A double-blind, randomized comparative study to investigate..:

Inoue, Satoshi ; Saito, Yoji ; Tsuneto, Satoru...
Japanese Journal of Clinical Oncology.  48 (2018)  5 - p. 442-449 , 2018
 
?
9

A randomized, double-blind, non-inferiority study of hydrom..:

Inoue, Satoshi ; Saito, Yoji ; Tsuneto, Satoru...
Japanese Journal of Clinical Oncology.  48 (2018)  6 - p. 542-547 , 2018
 
?
 
?
 
1-15