Ueda, Osamu
1066  Ergebnisse:
Personensuche X
?
2

Analysis of InGaAs/InP p-I-n Photodiode Failed by Electrost..:

Ito, Yuta ; Yokogawa, Ryo ; Ueda, Osamu...
Journal of Electronic Materials.  52 (2023)  8 - p. 5150-5158 , 2023
 
?
 
?
6

List of contributors:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
Bowers, John E. ; Caria, A. ; De Santi, C.... - p. xi , 2021
 
?
7

Reliability of semiconductor lasers and optoelectronic devi.. 

Woodhead Publishing series in electronic and optical materials
 
?
8

3,5,7,3′,4′-Pentamethoxyflavone Enhances the Barrier Functi..:

Mayangsari, Yunika ; Sugimachi, Natsumi ; Xu, Wenxi...
Journal of Agricultural and Food Chemistry.  69 (2021)  35 - p. 10174-10183 , 2021
 
?
9

Grown-in defects and thermal instability affecting the reli..:

, In: Reliability of Semiconductor Lasers and Optoelectronic Devices,
Ueda, Osamu ; Tomiya, Shigetaka - p. 177-238 , 2021
 
?
10

Plan-view TEM observation of a single-domain κ-Ga2O3 thin f..:

Nishinaka, Hiroyuki ; Ueda, Osamu ; Ito, Yusuke...
Japanese Journal of Applied Physics.  61 (2021)  1 - p. 018002 , 2021
 
?
11

Effect of misalignment at 2nd vane endwall on heat transfer..:

Kim, JeongJu ; Sohn, Ho-Seong ; Choi, Seungyeong...
International Journal of Heat and Mass Transfer.  170 (2021)  - p. 121034 , 2021
 
?
 
?
13

Novel strategy of rapid typing of Shiga toxin-producing Esc..:

Kubo, Yumi ; Ueda, Osamu ; Nagamitsu, Sawa...
Journal of Infection and Chemotherapy.  27 (2021)  8 - p. 1137-1142 , 2021
 
?
14

Effects of seal installation in the mid-passage gap between..:

Park, Sehjin ; Kim, JeongJu ; Bang, Minho...
Applied Thermal Engineering.  189 (2021)  - p. 116683 , 2021
 
1-15