Ullah, Anees
183  Ergebnisse:
Personensuche X
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2

Efficient Protection of FPGA Implemented LDPC Decoders Agai..:

Gao, Zhen ; Cheng, Yinghao ; Liu, Qiang..
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  9 - p. 3770-3780 , 2023
 
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4

Efficient protection of polar decoders against Single Event..:

Tian, Dong ; Gao, Zhen ; Wang, Ruize...
Microelectronics Reliability.  149 (2023)  - p. 115234 , 2023
 
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5

Systematic Reliability Evaluation of FPGA Implemented CNN A..:

Gao, Zhen ; Gao, Shihui ; Yao, Yi...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  1 - p. 116-126 , 2023
 
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Identification of lead compound screened from the natural p..:

Ullah, Shahid ; Rahman, Wajeeha ; Ullah, Farhan...
Journal of Biomolecular Structure and Dynamics.  42 (2023)  9 - p. 4851-4861 , 2023
 
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A Methodology for the Design of Fault Tolerant Parallel Dig..:

Gao, Zhen ; Xiao, Jiajun ; Liu, Qiang..
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  5 - p. 2003-2015 , 2023
 
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10

Reliability Evaluation and Fault Tolerance Design for FPGA ..:

Gao, Zhen ; Shi, Jinchang ; Liu, Qiang..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  1 - p. 142-146 , 2023
 
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11

Machine Learning Based Miscellaneous Objects Detection with..:

, In: Advances in Deep Generative Models for Medical Artificial Intelligence; Studies in Computational Intelligence,
Mahmood, Zahid ; Ullah, Anees ; Khan, Tahir. - p. 201-223 , 2023
 
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12

Toward Optimal Softcore Carry-aware Approximate Multipliers..:

Awais, Muhammad ; Zahir, Ali ; Shah, Syed Ayaz Ali...
ACM Transactions on Embedded Computing Systems.  22 (2023)  4 - p. 1-19 , 2023
 
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13

Error-Resilient Data Compression With Tunstall Codes:

Liu, Shanshan ; Reviriego, Pedro ; Ullah, Anees..
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  5 - p. 1963-1975 , 2023
 
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15

Soft Error Tolerant Convolutional Neural Networks on FPGAs ..:

Gao, Zhen ; Zhang, Han ; Yao, Yi...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  30 (2022)  3 - p. 291-302 , 2022
 
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