Utriainen, Mikko
69  Ergebnisse:
Personensuche X
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1

3D Thin Film Metrology without Cross-Sectional Sampling:

, In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM),
 
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5

Saturation profile based conformality analysis for atomic l..:

Yim, Jihong ; Ylivaara, Oili M. E. ; Ylilammi, Markku...
Physical Chemistry Chemical Physics.  22 (2020)  40 - p. 23107-23120 , 2020
 
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7

Correction to "Film Conformality and Extracted Recombinatio..:

Arts, Karsten ; Utriainen, Mikko ; Puurunen, Riikka L...
The Journal of Physical Chemistry C.  124 (2019)  1 - p. 1250-1250 , 2019
 
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8

Film Conformality and Extracted Recombination Probabilities..:

Arts, Karsten ; Utriainen, Mikko ; Puurunen, Riikka L...
The Journal of Physical Chemistry C.  123 (2019)  44 - p. 27030-27035 , 2019
 
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10

Luminescent bacteria-based sensing method for methylmercury..:

Rantala, Anne ; Utriainen, Mikko ; Kaushik, Nitesh...
Analytical and Bioanalytical Chemistry.  400 (2011)  4 - p. 1041-1049 , 2011
 
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11

Atomic layer deposition of tin dioxide sensing film in micr..:

Niskanen, Antti J. ; Varpula, Aapo ; Utriainen, Mikko...
Sensors and Actuators B: Chemical.  148 (2010)  1 - p. 227-232 , 2010
 
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14

SnO2 sol–gel derived thin films for integrated gas sensors:

Cobianu, Cornel ; Savaniu, Cristian ; Siciliano, Pietro...
Sensors and Actuators B: Chemical.  77 (2001)  1-2 - p. 496-502 , 2001
 
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