E-LIB Suche - Ergebnisse für: V. Banu

1

Reduced erythrocyte CR1 levels in patients with pulmonary t..:

Senbagavalli, P. ; Geetha, S.T. ; Karunakaran, K....
Clinical Immunology. 128 (2008) 1 - p. 109-115 , 2008

Link: https://doi.org/10.1016/..

2

PO-1091 GTV as prognostic marker in head and neck cancer - ..:

Ahmed, I. ; Krishnamurthy, S. ; Bhise, R....
Radiotherapy and Oncology. 170 (2022) - p. S926-S927 , 2022

Link: https://doi.org/10.1016/..

3

Power cycling analysis method for high-voltage SiC diodes:

Banu, V. ; Soler, V. ; Montserrat, J...
Microelectronics Reliability. 64 (2016) - p. 429-433 , 2016

Link: https://doi.org/10.1016/..

4

Application of Geo-Spatial Techniques for Precise Demarcati..:

Rao, S. S. ; Banu, V. ; Tiwari, A....
ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences. II-8 (2014) - p. 123-132 , 2014

Link: https://doi.org/10.5194/..

5

Temperature effects on the ruggedness of SiC Schottky diode..:

León, J. ; Perpiñà, X. ; Banu, V....
Microelectronics Reliability. 54 (2014) 9-10 - p. 2207-2212 , 2014

Link: https://doi.org/10.1016/..

6

Structural analysis of SiC Schottky diodes failure mechanis..:

León, J ; Berthou, M ; Perpiñà, X...
Journal of Physics D: Applied Physics. 47 (2013) 5 - p. 055102 , 2013

Link: https://doi.org/10.1088/..

7

Enhanced power cycling capability of SiC Schottky diodes us..:

Banu, V. ; Godignon, P. ; Perpiñà, X...
Microelectronics Reliability. 52 (2012) 9-10 - p. 2250-2255 , 2012

Link: https://doi.org/10.1016/..

8

Thermal cycling analysis of high temperature die-attach mat..:

Navarro, L.A. ; Perpiñà, X. ; Vellvehi, M...
Microelectronics Reliability. 52 (2012) 9-10 - p. 2314-2320 , 2012

Link: https://doi.org/10.1016/..

9

Recent progress in 3.3kV SiC diodes:

Brosselard, P. ; Banu, V. ; Camara, N..
Materials Science and Engineering: B. 165 (2009) 1-2 - p. 15-17 , 2009

Link: https://doi.org/10.1016/..

10

Behaviour of 1.2 kV SiC JBS diodes under repetitive high po..:

Banu, V. ; Brosselard, P. ; Jordá, X....
Microelectronics Reliability. 48 (2008) 8-9 - p. 1444-1448 , 2008

Link: https://doi.org/10.1016/..

11

Silicon carbide Schottky and ohmic contact process dependen..:

Badila, M. ; Brezeanu, G. ; Millan, J...
Diamond and Related Materials. 11 (2002) 3-6 - p. 1258-1262 , 2002

Link: https://doi.org/10.1016/..

12

Silicon-compatible waveguides used for an integrated opto-m..:

Muller, Raluca ; Obreja, Paula ; Banu, V...
Optical Materials. 17 (2001) 1-2 - p. 255-258 , 2001

Link: https://doi.org/10.1016/..

13

6H-SiC Diodes with Cellular Structure to Avoid Micropipe Ef..:

Badila, M. ; Brezeanu, Gheorghe ; Chante, Jean-Pierre...
Materials Science Forum. 338-342 (2000) - p. 1355-1358 , 2000

Link: https://doi.org/10.4028/..

14

Lift-off technology for SiC UV detectors:

Badila, M. ; Brezeanu, G. ; Millan, J....
Diamond and Related Materials. 9 (2000) 3-6 - p. 994-997 , 2000

Link: https://doi.org/10.1016/..

15

Post-irradiation effects in MOS structures:

Iliescu, Elena ; Codreanu, Cecilia ; Badila, M...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 161-163 (2000) - p. 381-386 , 2000

Link: https://doi.org/10.1016/..