VALLERO, ALESSANDRO
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Performance Monitor Counters: Interplay Between Safety and ..:

Carelli, Alberto ; Vallero, Alessandro ; Di Carlo, Stefano
IEEE Transactions on Device and Materials Reliability.  19 (2019)  1 - p. 73-83 , 2019
 
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Combining Cluster Sampling and ACE analysis to improve faul..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Vallero, Alessandro ; di Carlo, Stefano - p. 8138-8143 , 2019
 
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