Van Der Straten, Oscar
16  Ergebnisse:
Personensuche X
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1

Process and Tool Monitoring Strategy for Advanced Magnetic ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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2

Evaluation of different metal preclean conditions for MOL f..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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4

Method for improving stability of plasma ignition in a mult..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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5

ZERO THICKNESS DIFFUSION BARRIERS AND METALLIZATION LINERS ..:

Kaloyeros, Alain E. ; Eisenbraun, Eric T. ; Dunn, Kathleen.
Chemical Engineering Communications.  198 (2011)  11 - p. 1453-1481 , 2011
 
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10

Preface:

Roozeboom, Fred ; De Gendt, Stefan ; Elam, Jeffrey W...
Roozeboom , F , De Gendt , S , Elam , J W , Dendooven , J , van der Straten , O , Liu , C & Illibcri , A 2018 , ' Preface ' , ECS Transactions , vol. 86 , no. 6 , pp. iii-iv ..  , 2018
 
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11

Preface:Atomic Layer Deposition Applications 14:

Roozeboom, Fred ; De Gendt, Stefan ; Elam, Jeffrey W...
Roozeboom , F , De Gendt , S , Elam , J W , Dendooven , J , van der Straten , O , Liu , C & Illiberi , A 2018 , ' Preface : Atomic Layer Deposition Applications 14 ' , ECS Transactions , vol. 86 , no. 6 , pp. III-IV ..  , 2018
 
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14

Preface:Atomic Layer Deposition Applications 6:

Elam, Jeffrey W ; Roozeboom, Fred ; Delabie, Annelies...
Elam , J W , Roozeboom , F , Delabie , A , Van Der Straten , O , Bent , S F , De Gendt , S & Londergan , A 2010 , ' Preface : Atomic Layer Deposition Applications 6 ' , ECS Transactions , vol. 33 , no. 2 , pp. iii ..  , 2010
 
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15

Improved hull design with potential-flow-based parametric c..:

Van Straten, Oscar F.A ; Celik, Egemen ; De Baar, Jouke H.S..
Van Straten, O.F.A. [et al.]. Improved hull design with potential-flow-based parametric computer experiments. A: MARINE VIII. "MARINE VIII : proceedings of the VIII International Conference on Computational Methods in Marine Engineering". CIMNE, 2019, p. 321-333. ISBN 978-84-949194-3-5..  , 2019
 
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