Van Loo, Denis
134  Ergebnisse:
Personensuche X
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1

Spectral CT in the World of Electronics: Moving Toward Fail..:

Dewanckele, Jan ; Boone, Marijn ; Van Loo, Denis.
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 2003-2003 , 2023
 
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In situ Dynamic X-ray Tomography in the Laboratory:

Merkle, Arno ; Boone, Marijn ; Van Loo, Denis
Microscopy and Microanalysis.  24 (2018)  S1 - p. 998-999 , 2018
 
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