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Vandemaele, Michiel
19  Ergebnisse:
Personensuche X
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1

Compact Physics Hot-Carrier Degradation Model Valid over a ..:

Tyaginov, Stanislav ; Bury, Erik ; Grill, Alexander...
Micromachines.  14 (2023)  11 - p. 2018 , 2023
Link: https://doi.org/10.3390/..
 
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2

Impact of Nitridation on Bias Temperature Instability and H..:

Tyaginov, Stanislav ; O'Sullivan, Barry ; Chasin, Adrian...
Micromachines.  14 (2023)  8 - p. 1514 , 2023
Link: https://doi.org/10.3390/..
 
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3

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Car..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Kaczer, Ben ; Bury, Erik... - p. 1-10 , 2023
Link: https://doi.org/10.1109/..
 
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4

The properties, effect and extraction of localized defect p..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Kaczer, Ben ; Tyaginov, Stanislav... - p. 1-7 , 2021
Link: https://doi.org/10.1109/..
 
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5

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Makarov, Alexander ; Roussel, Philippe ; Bury, Erik...
Micromachines.  11 (2020)  7 - p. 657 , 2020
Link: https://doi.org/10.3390/..
 
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6

The Influence of Gate Bias on the Anneal of Hot-Carrier Deg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Vandemaele, Michiel ; Chuang, Kai-Hsin ; Bury, Erik... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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7

A Compact Physics Analytical Model for Hot-Carrier Degradat..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Tyaginov, Stanislav ; Grill, Alexander ; Vandemaele, Michiel... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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8

On Correlation between Hot-Carrier Stress Induced Device Pa..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Makarov, Alexander ; Roussel, Philippe ; Bury, Erik... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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9

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Makarov, Alexander ; Roussel, Philippe ; Bury, Erik...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7407495/.  , 2020
Link: http://www.ncbi.nlm.nih...
 
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10

Finite Size Effects in Highly Scaled Ruthenium Interconnect:

Dutta, Shibesh ; Moors, Kristof ; Vandemaele, Michiel.
http://arxiv.org/abs/1712.03859.  , 2017
Link: http://arxiv.org/abs/171..
 
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11

Impact of Nitridation on Bias Temperature Instability and H..:

Stanislav Tyaginov ; Barry O'Sullivan ; Adrian Chasin...
https://www.mdpi.com/2072-666X/14/8/1514.  , 2023
Link: https://doi.org/10.3390/..
 
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12

Impact of Nitridation on Bias Temperature Instability and H..:

Stanislav Tyaginov ; Barry O'Sullivan ; Adrian Chasin...
E:Engineering and Technology.  , 2023
Link: https://doi.org/10.3390/..
 
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13

Physical Modeling the Impact of Self-Heating on Hot-Carrier..:

Stanislav Tyaginov ; Alexander Makarov ; Erik Bury...
info:eu-repo/grantAgreement/EC/H2020/794950/.  , 2020
Link: https://zenodo.org/recor..
 
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14

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Alexander Makarov ; Philippe Roussel ; Erik Bury...
https://dx.doi.org/10.3390/mi11070657.  , 2020
Link: https://doi.org/10.3390/..
 
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15

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Alexander Makarov ; Philippe Roussel ; Erik Bury...
https://www.mdpi.com/2072-666X/11/7/657.  , 2020
Link: https://doi.org/10.3390/..
 
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