Vanhumbeeck, J.-F.
12  Ergebnisse:
Personensuche X
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1

XPS fast depth profile of the native oxide layers on AISI 3..:

Detriche, S. ; Vivegnis, S. ; Vanhumbeeck, J.-F....
Journal of Electron Spectroscopy and Related Phenomena.  243 (2020)  - p. 146970 , 2020
 
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6

Erratum to "In-situ monitoring of the dielectric and electr..:

Vanhumbeeck, J.-F. ; Proost, J.
Colloids and Surfaces B: Biointerfaces.  74 (2009)  1 - p. 389-390 , 2009
 
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11

In-situ monitoring of the dielectric and electrostrictive p..:

Vanhumbeeck, J.-F. ; Proost, J.
Colloids and Surfaces B: Biointerfaces.  56 (2007)  1-2 - p. 163-169 , 2007
 
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