Vasil'ev, L A
9708  Ergebnisse:
Personensuche X
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6

A Recombination-Enhanced-Defect-Reaction-Based Model for th..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Grasser, T. ; Feil, M. ; Waschneck, K.... - p. 3B.1-1-3B.1-7 , 2024
 
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8

Trap States and Carrier Diffusion in Czochralski (100) Sing..:

Nikolaev, V. I. ; Polyakov, A. Y. ; Krymov, V. M....
ECS Journal of Solid State Science and Technology.  13 (2024)  1 - p. 015003 , 2024
 
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9

E-beam induced micropattern generation and amorphization of..:

Melikyan, Y. ; Gharagulyan, H. ; Vasil'ev, A....
Colloid and Interface Science Communications.  58 (2024)  - p. 100766 , 2024
 
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15

Ultrasonic treatment duration: A nuanced parameter in synth..:

Efimov, M.N. ; Muratov, D.G. ; Klyuev, A.L....
Diamond and Related Materials.  142 (2024)  - p. 110804 , 2024
 
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