Veis, Pavel
75  Ergebnisse:
Personensuche X
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1

Depth profiling of W Ta based fusion-relevant samples using..:

Soni, Shweta ; Atikukke, Sahithya ; Veis, Matej...
Spectrochimica Acta Part B: Atomic Spectroscopy.  216 (2024)  - p. 106930 , 2024
 
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7

LIBS Protocol for the Assessment of Depth Profile, Homogene..:

Dwivedi, Vishal ; Prochazka, David ; Janičkovič, Dušan...
Spectrochimica Acta Part B: Atomic Spectroscopy.  196 (2022)  - p. 106509 , 2022
 
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11

Calibration-free analysis of a tungsten-based target for di..:

Marín Roldán, Alicia ; Pisarčík, Matej ; Veis, Matej..
Spectrochimica Acta Part B: Atomic Spectroscopy.  177 (2021)  - p. 106055 , 2021
 
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13

Collapse Mechanism in Few-Layer MoS2Langmuir Films:

Bodik, Michal ; Demydenko, Maksym ; Shabelnyk, Tetiana...
The Journal of Physical Chemistry C.  124 (2020)  29 - p. 15856-15861 , 2020
 
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15

An elevated concentration of MoS2 lowers the efficacy of li..:

Bodík, Michal ; Annušová, Adriana ; Hagara, Jakub...
Physical Chemistry Chemical Physics.  21 (2019)  23 - p. 12396-12405 , 2019
 
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