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Velazco, Raoul
278  Ergebnisse:
Personensuche X
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1

Medium-Earth-Orbit Spaceflight Radiation Effects in Triple ..:

Possamai Bastos, Rodrigo ; Picas, Martí Gorchs ; Velazco, Raoul
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1783-1790 , 2023
Link: https://doi.org/10.1109/..
 
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2

Nanosatellite On-Board Computer including a Many-Core Proce..:

, In: 2021 IEEE 22nd Latin American Test Symposium (LATS),
Pancher, Fabrice ; Vargas, Vanessa ; Ramos, Pablo... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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3

Error Rate Prediction of Applications Implemented in Multi-..:

, In: Radiation Effects on Integrated Circuits and Systems for Space Applications,
Ramos, Pablo ; Vargas, Vanessa ; Velazco, Raoul. - p. 145-173 , 2019
Link: https://doi.org/10.1007/..
 
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4

Improving Reliability of Multi-/Many-Core Processors by Usi..:

, In: Radiation Effects on Integrated Circuits and Systems for Space Applications,
Vargas, Vanessa ; Ramos, Pablo ; Méhaut, Jean-Francois. - p. 175-203 , 2019
Link: https://doi.org/10.1007/..
 
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5

Radiation Effects on Integrated Circuits and Systems for Sp..:

Velazco, Raoul ; McMorrow, Dale ; Estela, Jaime - 1st ed. 2019 . , 2019
Link: https://doi.org/10.1007/..
 
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6

Evaluation by Neutron Radiation of the NMR-MPar Fault-Toler..:

Vargas, Vanessa ; Ramos, Pablo ; Velazco, Raoul
Electronics.  7 (2018)  11 - p. 312 , 2018
Link: https://doi.org/10.3390/..
 
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7

NMR-MPar: A Fault-Tolerance Approach for Multi-Core and Man..:

Vargas, Vanessa ; Ramos, Pablo ; Méhaut, Jean-Francois.
Applied Sciences.  8 (2018)  3 - p. 465 , 2018
Link: https://doi.org/10.3390/..
 
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8

Assessing the Static and Dynamic Sensitivity of a Commercia..:

Ramos, Pablo F. ; Vargas, Vanessa C. ; Zergainoh, Nacer-Eddine.
Journal of Nanotechnology.  2018 (2018)  - p. 1-8 , 2018
Link: https://doi.org/10.1155/..
 
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9

Hardware implementation of a fault-tolerant Hopfield Neural..:

Clemente, Juan Antonio ; Mansour, Wassim ; Ayoubi, Rafic...
Neurocomputing.  171 (2016)  - p. 1606-1609 , 2016
Link: https://doi.org/10.1016/..
 
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10

Towards an efficient SEU effects emulation on SRAM-based FP..:

Souari, Anis ; Thibeault, Claude ; Blaquière, Yves.
Microelectronics Reliability.  66 (2016)  - p. 173-182 , 2016
Link: https://doi.org/10.1016/..
 
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11

SEU Fault-Injection in VHDL-Based Processors: A Case Study:

Mansour, Wassim ; Velazco, Raoul
Journal of Electronic Testing.  29 (2013)  1 - p. 87-94 , 2013
Link: https://doi.org/10.1007/..
 
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12

Reliability Limits of TMR Implemented in a SRAM-based FPGA:..:

Foucard, Gilles ; Peronnard, Paul ; Velazco, Raoul
Journal of Electronic Testing.  27 (2011)  5 - p. 627-633 , 2011
Link: https://doi.org/10.1007/..
 
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13

Radiation erffects on embedded systems:

Velazco, Raoul ; Fouillat, Pascal ; Reis, Ricardo , 2007
Exemplar:  Zentrale:E02 a elt 610.2 m/032
 
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14

The Eighth European Workshop on Radiation and Its Effects o.. 

IEEE transactions on nuclear science ; 52.2005,5,2
Velazco, Raoul , 2005
Exemplar:  Zentrale:Magazinturm-E02 15z phy 610 jc/414-52,2
 
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15

New Methodology for Simulation of Soft Errors in Digital Pr..:

Rezgui, Sana ; Velazco, Raoul ; Rodriguez, Santiago.
Journal of Spacecraft and Rockets.  39 (2002)  4 - p. 495-500 , 2002
Link: https://doi.org/10.2514/..
 
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