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Vinnakota, Bapiraju
21  Ergebnisse:
Personensuche X
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1

SCIP to the Next Generation of Computing: Extending More th..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Raghunathan, Vivek ; Muth, Karl ; Vinnakota, Bapiraju... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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2

An Open Inter-Chiplet Communication Link: Bunch of Wires (B..:

Ardalan, Shahab ; Farjadrad, Ramin ; Kuemerle, Mark...
IEEE Micro.  41 (2021)  1 - p. 54-60 , 2021
Link: https://doi.org/10.1109/..
 
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3

The Open Domain-Specific Architecture : Next Steps to Pr..:

, In: Proceedings of the Eight Annual ACM International Conference on Nanoscale Computing and Communication,
Vinnakota, Bapiraju - p. 1-5 , 2021
Link: https://dl.acm.org/doi/1..
 
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4

The Open Domain-Specific Architecture:

, In: 2020 IEEE Symposium on High-Performance Interconnects (HOTI),
Drucker, Kevin ; Jani, Dharmesh ; Agarwal, Ishwar... - p. 25-32 , 2020
Link: https://doi.org/10.1109/..
 
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5

Bunch of Wires: An Open Die-to-Die Interface:

, In: 2020 IEEE Symposium on High-Performance Interconnects (HOTI),
Ardalan, Shahab ; Cirit, Halil ; Farjad, Ramin... - p. 9-16 , 2020
Link: https://doi.org/10.1109/..
 
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6

High Capacity On-Package Physical Link Considerations:

, In: 2019 IEEE Symposium on High-Performance Interconnects (HOTI),
Taylor, Greg ; Farjadrad, Ramin ; Vinnakota, Bapiraju - p. 19-22 , 2019
Link: https://doi.org/10.1109/..
 
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7

A Bunch of Wires (BoW) Interface for Inter-Chiplet Communic..:

, In: 2019 IEEE Symposium on High-Performance Interconnects (HOTI),
Farjadrad, Ramin ; Vinnakota, Bapiraju - p. 27-273 , 2019
Link: https://doi.org/10.1109/..
 
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8

Combining dictionary coding and LFSR reseeding for test dat..:

, In: Proceedings of the 41st annual Design Automation Conference,
Sun, Xiaoyun ; Kinney, Larry ; Vinnakota, Bapiraju - p. 944-947 , 2004
Link: https://dl.acm.org/doi/1..
 
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9

Crosstalk fault detection by dynamic Idd:

, In: Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design,
Sun, Xiaoyun ; Kim, Seonki ; Vinnakota, Bapiraju - p. 375-378 , 2001
Link: https://dl.acm.org/doi/1..
 
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10

Fast test application technique without fast scan clocks:

, In: Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design,
Kim, Seonki ; Vinnakota, Bapiraju - p. 464-467 , 2000
Link: https://dl.acm.org/doi/1..
 
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11

Session details: Session 10D: digital and analog test gener..:

, In: Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design,
Vinnakota, Bapiraju ; Kajihara, Seiji , 2000
Link: https://dl.acm.org/doi/1..
 
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12

Deep submicron defect detection with the energy consumption..:

, In: Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design,
Vinnakota, Bapiraju - p. 467-470 , 1999
Link: https://dl.acm.org/doi/1..
 
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13

Digital detection of analog parametric faults in SC filters:

, In: Proceedings of the 36th annual ACM/IEEE Design Automation Conference,
Harjani, Ramesh ; Vinnakota, Bapiraju - p. 772-777 , 1999
Link: https://dl.acm.org/doi/1..
 
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14

IC test using the energy consumption ratio:

, In: Proceedings of the 36th annual ACM/IEEE Design Automation Conference,
Jiang, Wanli ; Vinnakota, Bapiraju - p. 976-981 , 1999
Link: https://dl.acm.org/doi/1..
 
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15

Fast state verification:

, In: Proceedings of the 35th annual Design Automation Conference,
Sun, Dechang ; Vinnakota, Bapiraju ; Jiang, Wanli - p. 619-624 , 1998
Link: https://dl.acm.org/doi/1..
 
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