E-LIB Suche - Ergebnisse für: Vladar, Andras

1

Electron Irradiation Cleaning of the SEM and its Samples:

Vladar, Andras ; Hoyle, David ; Kotaro, Hosoya
Microscopy and Microanalysis. 27 (2021) S1 - p. 434-435 , 2021

Link: https://doi.org/10.1017/..

2

Getting your Scanning Electron Microscope to Perform at Ato..:

Vladar, Andras ; Arat, Kerim
Microscopy and Microanalysis. 27 (2021) S1 - p. 1328-1329 , 2021

Link: https://doi.org/10.1017/..

3

Review of current progress in nanometrology with the helium..:

Postek, Michael T ; Vladár, András ; Archie, Charles.
Measurement Science and Technology. 22 (2010) 2 - p. 024004 , 2010

Link: https://doi.org/10.1088/..

4

Development of the metrology and imaging of cellulose nanoc..:

Postek, Michael T ; Vladár, András ; Dagata, John...
Measurement Science and Technology. 22 (2010) 2 - p. 024005 , 2010

Link: https://doi.org/10.1088/..

5

A Tumor-Targeted Nanodelivery System to Improve Early MRI D..:

Pirollo, Kathleen F. ; Dagata, John ; Wang, Paul...
Molecular Imaging. 5 (2006) 1 - p. 7290.2006.00005 , 2006

Link: https://doi.org/10.2310/..

6

Limits of Resolutions in the Scanning Electron Microscope:

Vladár, András E ; Arat, Kerim T
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 463-464 , 2023

Link: https://doi.org/10.1093/..

7

Tuning Geometric Chirality in Metallic and Hybrid Nanostruc..:

Liu, Hanyu ; Vladár, András E. ; Wang, Peng-Peng.
Journal of the American Chemical Society. 145 (2023) 13 - p. 7495-7503 , 2023

Link: https://doi.org/10.1021/..

8

Traceable Measurements using a Metrology Scanning Electron ..:

Damazo, Bradley ; Vladár, András E ; Marie-Rose, Olivier.
Microscopy and Microanalysis. 28 (2022) S1 - p. 3088-3090 , 2022

Link: https://doi.org/10.1017/..

9

Comparative study of multiwall carbon nanotube nanocomposit..:

Piao, Yanmei ; Tondare, Vipin N. ; Davis, Chelsea S....
Composites Science and Technology. 208 (2021) - p. 108753 , 2021

Link: https://doi.org/10.1016/..

10

Probing Electrified Liquid–Solid Interfaces with Scanning E..:

Guo, Hongxuan ; Yulaev, Alexander ; Strelcov, Evgheni...
ACS Applied Materials & Interfaces. 12 (2020) 50 - p. 56650-56657 , 2020

Link: https://doi.org/10.1021/..

11

Measurand-Optimized, Content-Aware Scanning Electron Micros..:

Vladár, András E. ; Damazo, Bradley N.
Microscopy and Microanalysis. 25 (2019) S2 - p. 244-245 , 2019

Link: https://doi.org/10.1017/..

12

Ionizing radiation processing and its potential in advancin..:

Postek, Michael T. ; Poster, Dianne L. ; Vládar, András E....
Radiation Physics and Chemistry. 143 (2018) - p. 47-52 , 2018

Link: https://doi.org/10.1016/..

13

Nondestructive shape process monitoring of three-dimensiona..:

Attota, Ravi Kiran ; Kang, Hyeonggon ; Scott, Keana...
Measurement Science and Technology. 29 (2018) 12 - p. 125007 , 2018

Link: https://doi.org/10.1088/..

14

Validation of Single Particle ICP-MS for Routine Measuremen..:

Montoro Bustos, Antonio R. ; Purushotham, Kavuri P. ; Possolo, Antonio...
Analytical Chemistry. 90 (2018) 24 - p. 14376-14386 , 2018

Link: https://doi.org/10.1021/..

15

Three-Dimensional (3D) Nanometrology Based on Scanning Elec..:

Tondare, Vipin N. ; Villarrubia, John S. ; Vladár, András E.
Microscopy and Microanalysis. 23 (2017) 5 - p. 967-977 , 2017

Link: https://doi.org/10.1017/..