E-LIB Suche - Ergebnisse für: W. Mertens, Paul

1

Morphology Change of Artificial Crystal Originated Particle..:

Twan Bearda, Twan Bearda ; Paul W. Mertens, Paul W. Mertens ; Marc M. Heyns, Marc M. Heyns.
Japanese Journal of Applied Physics. 39 (2000) 8B - p. L841 , 2000

Link: https://doi.org/10.1143/..

2

Breakdown and Recovery of Thin Gate Oxides:

Twan Bearda, Twan Bearda ; Paul W. Mertens, Paul W. Mertens ; Marc M. Heyns, Marc M. Heyns..
Japanese Journal of Applied Physics. 39 (2000) 6B - p. L582 , 2000

Link: https://doi.org/10.1143/..

3

Stress in Thin Micro-Zone-Molten Crystalline Silicon Films ..:

Paul W. Mertens, Paul W. Mertens ; Herman E. Maes, Herman E. Maes
Japanese Journal of Applied Physics. 32 (1993) 7R - p. 3217 , 1993

Link: https://doi.org/10.1143/..

4

Ultra Clean Processing of Semiconductor Surfaces XV

Solid State Phenomena Ser, v. Volume 314

Mertens, Paul W ; Wostyn, Kurt ; Meuris, Marc. , 2021

Link: https://search.ebscohost..

5

Non-uniformly receding contact line breaks axisymmetric flo..:

Kim, Hyoungsoo ; Belmiloud, Naser ; Mertens, Paul W.
The European Physical Journal Special Topics. 229 (2020) 10 - p. 1771-1784 , 2020

Link: https://doi.org/10.1140/..

6

Quantitative Modelling of Deposition of Airborne Molecular ..:

Mertens, Paul W.
ECS Transactions. 92 (2019) 2 - p. 237-244 , 2019

Link: https://doi.org/10.1149/..

7

List of Contributors:

, In: Handbook of Silicon Wafer Cleaning Technology,

Bakhtari, Kaveh ; Bearda, Twan ; Beaudoin, Stephen P.... - p. xi , 2018

Link: https://doi.org/10.1016/..

8

Overview of Wafer Contamination and Defectivity:

, In: Handbook of Silicon Wafer Cleaning Technology,

Bearda, Twan ; Mertens, Paul W. ; Beaudoin, Stephen P. - p. 87-149 , 2018

Link: https://doi.org/10.1016/..

9

Study of Mass Transport for Efficient Fluid Processing:

Mertens, Paul W. ; Haslinger, Michael ; Soha, Marton.
ECS Transactions. 80 (2017) 2 - p. 73-79 , 2017

Link: https://doi.org/10.1149/..

10

Contributors:

, In: Developments in Surface Contamination and Cleaning,

Arnauts, Sophia ; Attavar, Sachin ; Bearda, Twan... - p. xxi-xxii , 2016

Link: https://doi.org/10.1016/..

11

Ultra Clean Processing of Semiconductor Surfaces XIII

Solid State Phenomena Vol. 255

Mertens, Paul W ; Meuris, Marc ; Heyns, Marc , 2016

Link: https://search.ebscohost..

12

(Invited) Selective Etch of Si and SiGe for Gate All-Around..:

Wostyn, Kurt ; Sebaai, Farid ; Rip, Jens...
ECS Transactions. 69 (2015) 8 - p. 147-152 , 2015

Link: https://doi.org/10.1149/..

13

Oxygen Control Challenge for Advanced Wet Processing:

Yoshida, Yukifumi ; Otsuji, Masayuki ; Takahashi, H....
ECS Transactions. 69 (2015) 8 - p. 29-35 , 2015

Link: https://doi.org/10.1149/..

14

Dissolution of Germanium in Sulfuric Acid Based Solutions:

Gan, Nobuko ; Ogawa, Yuichi ; Nagai, Tatsuo...
ECS Transactions. 69 (2015) 8 - p. 277-284 , 2015

Link: https://doi.org/10.1149/..

15

Contamination Specifications, an Overall Perspective:

Mertens, Paul W
ECS Transactions. 69 (2015) 8 - p. 87-93 , 2015

Link: https://doi.org/10.1149/..