WANG Runsheng
1206  Ergebnisse:
Personensuche X
?
1

Post-layout simulation driven analog circuit sizing:

Gao, Xiaohan ; Zhang, Haoyi ; Ye, Siyuan...
Science China Information Sciences.  67 (2024)  4 - p. , 2024
 
?
3

Unveiling RowPress in Sub-20 nm DRAM Through Comparative An..:

Zhou, Longda ; Ye, Sheng ; Wang, Runsheng.
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4677-4684 , 2024
 
?
4

Viewpoint Disentangling and Generation for Unsupervised Obj..:

Li, Zongyi ; Shi, Yuxuan ; Ling, Hefei...
ACM Transactions on Multimedia Computing, Communications, and Applications.  20 (2024)  5 - p. 1-23 , 2024
 
?
5

Accelerating Device-Circuit Self-Heating Simulations with D..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Chen, Sihao ; Li, Yu ; Peng, Baokang... - p. 7C.1-1-7C.1-6 , 2024
 
?
7

A Device-Circuit Aging Simulation Framework Integrating Tra..:

Li, Yu ; Xue, Yongkang ; Sun, Zixuan...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 206-212 , 2024
 
?
8

Uncertainty-Guided Person Search Model with Auxiliary Shall..:

, In: ICASSP 2024 - 2024 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP),
Li, Zongyi ; Li, Zhongyang ; Shi, Yuxuan... - p. 4795-4799 , 2024
 
?
9

Enabling Low-Power Charge-Domain Nonvolatile Computing-in-M..:

Wang, Xuepei ; Cui, BoYao ; Jing, Lingling...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2404-2410 , 2024
 
?
10

A 16.38TOPS and 4.55POPS/W SRAM Computing-in-Memory Macro f..:

Qiao, Xin ; Guo, Qingyu ; Tang, Xiyuan...
IEEE Transactions on Circuits and Systems I: Regular Papers.  71 (2024)  4 - p. 1706-1718 , 2024
 
?
11

A Physics-Oriented Model of Cryogenic MOSFETs including the..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Zhang, Xinyue ; Zhang, Fangxing ; Wang, Zirui... - p. 1-3 , 2024
 
?
12

Sub-20-nm DRAM Technology under Negative Bias Temperature I..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Wang, Da ; Xue, Yongkang ; Liu, Yong... - p. 9B.2-1-9B.2-7 , 2024
 
?
13

Investigation of Positive Bias Temperature Instability in a..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Xue, Yongkang ; Yuan, Miaojia ; Li, Yu... - p. 1-5 , 2024
 
?
14

Understanding Retention Time Distribution in Buried-Channel..:

Liu, Yong ; Wang, Da ; Ren, Pengpeng...
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4469-4475 , 2024
 
1-15