E-LIB Suche - Ergebnisse für: Wang, Jer Chyi

1

Nb2O5 and Ti-Doped Nb2O5 Charge Trapping Nano-Layers Applie..:

Wang, Jer Chyi ; Kao, Chyuan Haur ; Wu, Chien Hung..
Nanomaterials. 8 (2018) 10 - p. 799 , 2018

Link: https://doi.org/10.3390/..

2

Comparison of ZnO and Ti-doped ZnO sensing membrane applied..:

Lee, Ming Ling ; Wang, Jer Chyi ; Kao, Chyuan Haur...
Ceramics International. 44 (2018) 6 - p. 6081-6088 , 2018

Link: https://doi.org/10.1016/..

3

Ti-doped Gd2O3 sensing membrane for electrolyte–insulator–s..:

Kao, Chyuan Haur ; Wang, Jer Chyi ; Lai, Chao Sung...
Thin Solid Films. 520 (2012) 10 - p. 3760-3763 , 2012

Link: https://doi.org/10.1016/..

4

Current Transport Mechanism for HfO[sub 2] Gate Dielectrics..:

Wu, Woei Cherng ; Lai, Chao Sung ; Wang, Tzu Ming...
Electrochemical and Solid-State Letters. 11 (2008) 1 - p. H15 , 2008

Link: https://doi.org/10.1149/..

5

Characteristics of Fluorine Implantation for HfO2 Gate Diel..:

Lai, Chao Sung ; Wu, Woei Cherng ; Wang, Jer Chyi.
Japanese Journal of Applied Physics. 45 (2006) 4S - p. 2893 , 2006

Link: https://doi.org/10.1143/..

6

Suppression of interfacial reaction for HfO2 on silicon by ..:

Lai, Chao Sung ; Wu, Woei Cherng ; Chao, Tien Sheng...
Applied Physics Letters. 89 (2006) 7 - p. , 2006

Link: https://doi.org/10.1063/..

7

Soft breakdown of hafnium oxynitride gate dielectrics:

Wang, Jer Chyi ; Shie, De Ching ; Lei, Tan Fu.
Journal of Applied Physics. 98 (2005) 2 - p. , 2005

Link: https://doi.org/10.1063/..

8

Effects of Post CF4 Plasma Treatment on the HfO2 Thin Film:

Lai, Chao Sung ; Wu, Woei Cherng ; Fan, Kung Ming..
Japanese Journal of Applied Physics. 44 (2005) 4S - p. 2307 , 2005

Link: https://doi.org/10.1143/..

9

Characterization of CF4-plasma fluorinated HfO2 gate dielec..:

Lai, Chao Sung ; Wu, Woei Cherng ; Wang, Jer Chyi.
Applied Physics Letters. 86 (2005) 22 - p. , 2005

Link: https://doi.org/10.1063/..

10

Carrier Transportation of Rapid Thermal Annealed CeO[sub 2]..:

Wang, Jer Chyi ; Chiang, Kuo Cheng ; Lei, Tan Fu.
Electrochemical and Solid-State Letters. 7 (2004) 12 - p. E55 , 2004

Link: https://doi.org/10.1149/..

11

Characterization of Temperature Dependence for HfO[sub 2] G..:

Wang, Jer Chyi ; Shie, De Ching ; Lei, Tan Fu.
Electrochemical and Solid-State Letters. 6 (2003) 10 - p. F34 , 2003

Link: https://doi.org/10.1149/..

12

Highly compatible and reliable ZrN interfacial layer betwee..:

Liu, Yu-Hua ; Tai, Han-Hsiang ; Ho, Chi-An...
Journal of the European Ceramic Society. 44 (2024) 1 - p. 215-223 , 2024

Link: https://doi.org/10.1016/..

13

A Fast-Transient Output-Capacitor-Less Low-Dropout Regulato..:

Kao, Shao-Ku ; Chen, Jian-Jiun ; Liao, Chien-Hung..
IEEE Access. 12 (2024) - p. 66539-66555 , 2024

Link: https://doi.org/10.1109/..

14

Advanced Impacts of Nanotechnology and Intelligence:

LAI, Chao-Sung ; Chakraborty, Ishita ; Tai, Han-Hsiang...
IEEE Nanotechnology Magazine. 17 (2023) 1 - p. 13-21 , 2023

Link: https://doi.org/10.1109/..

15

Pattern Recognition Accuracy Optimization of Unsupervised S..:

Fu, Yi ; Huang, Chu-Chun ; Lin, Zi-Yi..
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4473-4478 , 2023

Link: https://doi.org/10.1109/..