E-LIB Suche - Ergebnisse für: Wang, Laung-Terng

1

Low-Power Scan-Based Built-In Self-Test Based on Weighted P..:

Xiang, Dong ; Wen, Xiaoqing ; Wang, Laung-Terng
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25 (2017) 3 - p. 942-953 , 2017

Link: https://doi.org/10.1109/..

2

CPP-ATPG: A Circular Pipeline Processing Based Deterministi..:

Yeh, Kuen-Wei ; Huang, Jiun-Lang ; Wang, Laung-Terng
Journal of Electronic Testing. 32 (2016) 5 - p. 625-638 , 2016

Link: https://doi.org/10.1007/..

3

On Achieving Capture Power Safety in At-Speed Scan-Based Lo..:

TOMITA, Akihiro ; WEN, Xiaoqing ; SATO, Yasuo...
IEICE Transactions on Information and Systems. E97.D (2014) 10 - p. 2706-2718 , 2014

Link: https://doi.org/10.1587/..

4

Testing of Synchronizers in Asynchronous FIFO:

Kim, Hyoung-Kook ; Wang, Laung-Terng ; Wu, Yu-Liang.
Journal of Electronic Testing. 29 (2013) 1 - p. 49-72 , 2013

Link: https://doi.org/10.1007/..

5

Scan Flip-Flop Grouping to Compress Test Data and Compact T..:

Xiang, Dong ; Chen, Zhen ; Wang, Laung-Terng
ACM Transactions on Design Automation of Electronic Systems. 17 (2012) 2 - p. 1-24 , 2012

Link: https://doi.org/10.1145/..

6

Launch-on-Shift Test Generation for Testing Scan Designs Co..:

Wu, Shianling ; Wang, Laung-Terng ; Wen, Xiaoqing...
ACM Transactions on Design Automation of Electronic Systems (TODAES). 17 (2012) 4 - p. 1-16 , 2012

Link: https://dl.acm.org/doi/1..

7

Launch-on-Shift Test Generation for Testing Scan Designs Co..:

Wu, Shianling ; Wang, Laung-Terng ; Wen, Xiaoqing...
ACM Transactions on Design Automation of Electronic Systems. 17 (2012) 4 - p. 1-16 , 2012

Link: https://doi.org/10.1145/..

8

Scan Flip-Flop Grouping to Compress Test Data and Compact T..:

Xiang, Dong ; Chen, Zhen ; Wang, Laung-Terng
ACM Transactions on Design Automation of Electronic Systems (TODAES). 17 (2012) 2 - p. 1-24 , 2012

Link: https://dl.acm.org/doi/1..

9

High Launch Switching Activity Reduction in At-Speed Scan T..:

MIYASE, Kohei ; WEN, Xiaoqing ; FURUKAWA, Hiroshi...
IEICE Transactions on Information and Systems. E93-D (2010) 1 - p. 2-9 , 2010

Link: https://doi.org/10.1587/..

10

Fault Modeling and Analysis for Resistive Bridging Defects ..:

Kim, Hyoung-Kook ; Jone, Wen-Ben ; Wang, Laung-Terng
Journal of Electronic Testing. 26 (2010) 3 - p. 367-392 , 2010

Link: https://doi.org/10.1007/..

11

Electronic design automation

synthesis, verification, and test The Morgan Kaufmann series in systems on silicon

Wang, Laung-Terng ; Chang, Yao-Wen ; Cheng, Kwang-Ting , 2009

Exemplar: Zentrale:E02 a inf 110 m/626

12

Turbo1500: Core-Based Design for Test and Diagnosis:

Wang, Laung-Terng ; Apte, Ravi ; Wu, Shianling...
IEEE Design & Test of Computers. 26 (2009) 1 - p. 26-35 , 2009

Link: https://doi.org/10.1109/..

13

Electronic design automation: synthesis, verification, and ..:

Wang, Laung-Terng ; Chang, Yao-Wen ; Cheng, Kwang-Ting , 2009

Link: https://learning.oreilly..

14

Electronic design automation: synthesis, verification, and ..

The Morgan Kaufmann series in systems on silicon

Wang, Laung-Terng ; Chang, Yao-Wen ; Cheng, Kwang-Ting , 2009

Link: https://www.sciencedirec..

15

Electronic design automation: synthesis, verification, and ..

The Morgan Kaufmann series in systems on silicon

Wang, Laung-Terng ; Chang, Yao-Wen ; Cheng, Kwang-Ting , 2009

Link: https://search.ebscohost..