Wei, Chao-Nan
17978  Ergebnisse:
Personensuche X
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4

Patterns of Exposing Integrity of 28nm-node High-k Gate Die..:

, In: 202020 3rd IEEE International Conference on Knowledge Innovation and Invention (ICKII),
Li, Si-Ping ; Xu, Jia-Wei ; Li, Wei-Hao... - p. 67-70 , 2020
 
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5

Punch-through and DIBL Effects Exposing Nano-node SOI FinFE..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Wang, Mu-Chun ; Shen, Tien-Szu ; Bor, Hui-Yun... - p. 1-5 , 2019
 
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6

Bifunctional perovskite electrocatalyst and PVDF/PET/PVDF s..:

Wei, Chao-Nan ; Karuppiah, Chelladurai ; Yang, Chun-Chen..
Journal of Physics and Chemistry of Solids.  133 (2019)  - p. 67-78 , 2019
 
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8

PVDF-HFP/PET/PVDF-HFP composite membrane for lithium-ion po..:

Wu, Yi-Shiuan ; Yang, Chun-Chen ; Luo, Sin-Ping...
International Journal of Hydrogen Energy.  42 (2017)  10 - p. 6862-6875 , 2017
 
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10

Thin Film Deposition of Semiconducting Ni-Co Oxide Spinel w..:

Tsai, Shu-Yi ; Fung, Kuan-Zong ; Wei, Chao-Nan.
Journal of Electronic Materials.  43 (2014)  7 - p. 2584-2587 , 2014
 
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11

Influence of microstructure and its evolution on the mechan..:

Liao, Jian-Hong ; Bor, Hui-Yun ; Wei, Chao-Nan..
Materials Science and Engineering: A.  539 (2012)  - p. 93-100 , 2012
 
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12

The influence of carbon addition on carbide characteristics..:

Wei, Chao-Nan ; Bor, Hui-Yun ; Chang, Li
Journal of Alloys and Compounds.  509 (2011)  18 - p. 5708-5714 , 2011
 
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13

Effect of Postdeposition Oxidation and Subsequent Reduction..:

Wang, Chin-Hui ; Chen, Shih-Wei ; Wu, Jenn-Ming..
Electrochemical and Solid-State Letters.  14 (2011)  3 - p. P5 , 2011
 
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14

Characterization of chromium thin films by sputter depositi..:

Wang, Sea-Fue ; Lin, Hsui-Chi ; Bor, Hui-Yun..
Journal of Alloys and Compounds.  509 (2011)  41 - p. 10110-10114 , 2011
 
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15

Effect of serrated grain boundaries on the creep property o..:

Yeh, An-Chou ; Lu, Kang-Wei ; Kuo, Chen-Ming..
Materials Science and Engineering: A.  530 (2011)  - p. 525-529 , 2011
 
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