Wei, Seit Wen
188  Ergebnisse:
Personensuche X
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1

A Heterogeneously Integrated Wafer-level Processed Co-Packa..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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2

A Novel Packaging Platform for High-Performance Optical Eng..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
 
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3

Development of Nitride-Based Optical Phased Array at 1092 n..:

Lim, Yu Dian ; Goh Chun Kiat, Simon ; Seit, Wen Wei...
IEEE Photonics Technology Letters.  35 (2023)  16 - p. 855-857 , 2023
 
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4

Simplified Assembly of Through-Silicon-Via Integrated Ion T..:

Zhao, Peng ; Li, Hong Yu ; Likforman, Jean-Pierre...
IEEE Transactions on Components, Packaging and Manufacturing Technology.  13 (2023)  9 - p. 1337-1343 , 2023
 
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5

The Integration of Grounding Plane into TSV Integrated Ion ..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Zhao, Peng ; Li, Hong Yu ; Dian Lim, Yu... - p. 137-142 , 2022
 
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6

Comprehensive Study on Die Shift with Ultra-Large Embedded ..:

, In: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC),
Seit, Wen Wei ; Chong, Ser Choong ; Lim, Sharon. - p. 150-155 , 2022
 
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7

Ceramic Pin Grid Array with Built-in Interconnects to Locat..:

, In: 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC),
Zhao, Peng ; Li, Hong Yu ; Lim, Yu Dian... - p. 1-5 , 2022
 
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8

Comprehensive study on effect of chip layout and mold thick..:

, In: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC),
 
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10

Glass Substrate Interposer for TSV-integrated Surface Elect..:

, In: 2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC),
Zhao, Peng ; Li, Hong Yu ; Lim, Yu Dian... - p. 262-265 , 2020
 
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11

Surface Electrode Ion Trap Developed and Improvement by Oxi..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Li, H.Y. ; Seit, Wen Wei ; Gilho, Hwang... - p. 1-5 , 2020
 
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12

Simplified Assembly of Through-Silicon-Via Integrated Ion T..:

Zhao, Peng ; Li, Hong Yu ; Likforman, Jean-Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2023.3309831.  , 2023
 
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13

Simplified Assembly of Through-Silicon-Via Integrated Ion T..:

Zhao, Peng ; Li, Hong Yu ; Likforman, Jean-Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2023.3309831.  , 2023
 
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14

RF performance benchmarking of TSV integrated surface elect..:

Zhao, Peng ; Li, Hong Yu ; Tao, Jing...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2021.3114172.  , 2021
 
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15

RF performance benchmarking of TSV integrated surface elect..:

Zhao, Peng ; Li, Hong Yu ; Tao, Jing...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCPMT.2021.3114172.  , 2021
 
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