Weimin Han
1629  Ergebnisse:
Personensuche X
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1

Research and implementation of license plate recognition te..:

, In: 2012 24th Chinese Control and Decision Conference (CCDC),
Jianyu Zhao ; Shujian Ma ; Weimin Han.. - p. 3768-3773 , 2012
 
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2

Minimum error bound of signal reconstruction:

Ge Wan ; Weimin Han
IEEE Signal Processing Letters.  6 (1999)  12 - p. 309-311 , 1999
 
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3

Analysis of some mixed elements for the Stokes problem:

Xiao-liang Cheng ; Weimin Han ; Hong-ci Huang
Journal of Computational and Applied Mathematics.  85 (1997)  1 - p. 19-35 , 1997
 
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4

Optimization of Supply Chain Scheduling Based on Genetic Pa..:

, In: Proceedings of the 3rd International Conference on Cognitive Based Information Processing and Applications—Volume 2; Lecture Notes on Data Engineering and Communications Technologies,
Ma, Zhongneng ; Li, Chunhui ; Wu, Zhigang.. - p. 537-550 , 2024
 
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6

On a Stokes hemivariational inequality for incompressible f..:

Han, Weimin ; Qiu, Hailong ; Mei, Liquan
Nonlinear Analysis: Real World Applications.  79 (2024)  - p. 104131 , 2024
 
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7

On well-posedness of Navier–Stokes variational inequalities:

Han, Weimin ; Yao, Yuan
Applied Mathematics Letters.  155 (2024)  - p. 109121 , 2024
 
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9

Numerical analysis of a history-dependent mixed hemivariati..:

Ling, Min ; Xiao, Wenqiang ; Han, Weimin
Computers & Mathematics with Applications.  166 (2024)  - p. 65-76 , 2024
 
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10

αℓ1−βℓ2 sparsity regularization for nonlinear ill-posed pro..:

Ding, Liang ; Han, Weimin
Journal of Computational and Applied Mathematics.  450 (2024)  - p. 115987 , 2024
 
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11

Bradykinin-pretreated Human cardiac-specific c-kit+ Cells E..:

Li, Jingzhou ; Song, Fei ; Chen, Ruolan...
Stem Cell Reviews and Reports.  19 (2023)  7 - p. 2481-2496 , 2023
 
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12

Dynamic risk assessment model for third-party damage to bur..:

Zhao, Lei ; Yang, Rui ; Bao, Jingming...
Engineering Failure Analysis.  154 (2023)  - p. 107682 , 2023
 
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15

Origin of Current Variations in Ultrathin Bipolar Junction ..:

Hong, Min ; Zhang, Peijian ; Chen, Xian...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4532-4537 , 2023
 
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