Weng, You-Chen
10183  Ergebnisse:
Personensuche X
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2

Low contact resistance and high breakdown voltage of AlGaN/..:

Hieu, Le Trung ; Rathaur, Shivendra K ; Lu, Chee-How...
Semiconductor Science and Technology.  39 (2024)  8 - p. 085006 , 2024
 
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3

The effect of the barrier thickness on DC and RF performanc..:

Wang, Chun ; Hsu, Heng-Tung ; Lin, Jui-Lung...
Semiconductor Science and Technology.  38 (2023)  7 - p. 074004 , 2023
 
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4

Effect of Local Substrate Removal and Backside Al Heat Diss..:

Lin, Yuan ; Huang, Hsuan-Yao ; Weng, You-Chen...
ECS Journal of Solid State Science and Technology.  12 (2023)  9 - p. 095005 , 2023
 
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5

High Current Density and Low Ron Quaternary InAlGaN MIS-HEM..:

Weng, You-Chen ; Chung, Chin-Han ; Ma, Cheng-Jun...
ECS Journal of Solid State Science and Technology.  12 (2023)  7 - p. 075003 , 2023
 
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6

Effect of TiN barrier layer in Cu-based ohmic contact of Al..:

Chang, Bei Rong ; Panda, Debashis ; Weng, You-Chen..
Semiconductor Science and Technology.  38 (2023)  8 - p. 084001 , 2023
 
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12

Ferroelectric-like behavior in HfO2/Al2O3/AlN metal-insulat..:

Kao, Min-Lu ; Lin, Yuan ; Weng, You-Chen..
Materials Research Express.  9 (2022)  10 - p. 105903 , 2022
 
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13

Hf-Based and Zr-Based Charge Trapping Layer Engineering for..:

Wu, Jui-Sheng ; Lee, Chih-Chieh ; Wu, Chia-Hsun...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 525-531 , 2022
 
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