Wintersberger, E.
72  Ergebnisse:
Personensuche X
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2

Algorithms for the calculation of X-ray diffraction pattern..:

Wintersberger, E. ; Kriegner, D. ; Hrauda, N...
Journal of Applied Crystallography.  43 (2010)  6 - p. 1287-1299 , 2010
 
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7

Phonon strain shift coefficients in Si1−xGex alloys:

Pezzoli, F. ; Bonera, E. ; Grilli, E....
Journal of Applied Physics.  103 (2008)  9 - p. , 2008
 
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8

Raman spectroscopy determination of composition and strain ..:

Pezzoli, F. ; Bonera, E. ; Grilli, E....
Materials Science in Semiconductor Processing.  11 (2008)  5-6 - p. 279-284 , 2008
 
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9

Erratum to "Raman spectroscopy of Si1−Geepilayers" [Mater. ..:

Pezzoli, F. ; Martinelli, Lucio ; Grilli, E....
Materials Science and Engineering: B.  137 (2007)  1-3 - p. 315 , 2007
 
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12

Strain-induced shift of phonon modes in alloys:

Pezzoli, F. ; Grilli, E. ; Guzzi, M....
Materials Science in Semiconductor Processing.  9 (2006)  4-5 - p. 541-545 , 2006
 
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13

In situ investigation by GISAXS and GIXD of the growth mode..:

Richard, M.-I. ; Schülli, T.-U. ; Wintersberger, E...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  246 (2006)  1 - p. 35-38 , 2006
 
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14

Raman spectroscopy of Si1−xGex epilayers:

Pezzoli, F. ; Martinelli, Lucio ; Grilli, E....
Materials Science and Engineering: B.  124-125 (2005)  - p. 127-131 , 2005
 
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