Wu, Cheng-Wen
~ 89000  Ergebnisse:
Personensuche X
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1

A Built-In Self-Calibration Scheme for Memristor-Based Spik..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Tung, Chi ; Hou, Kuan-Wei ; Wu, Cheng-Wen - p. 1-4 , 2023
 
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3

A 40-nm 1.89-pJ/SOP Scalable Convolutional Spiking Neural N..:

Tan, Pai-Yu ; Wu, Cheng-Wen
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  12 - p. 1994-2007 , 2023
 
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4

Effective and Efficient Test and Diagnosis Pattern Generati..:

, In: 2023 IEEE International 3D Systems Integration Conference (3DIC),
 
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5

A Low-Bitwidth Integer-STBP Algorithm for Efficient Trainin..:

, In: Proceedings of the 28th Asia and South Pacific Design Automation Conference,
Tan, Pai-Yu ; Wu, Cheng-Wen - p. 651-656 , 2023
 
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6

A Memory Built-In Peer-Repair Architecture for Mesh-Connect..:

, In: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
 
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7

Improving Test Quality of Memory Chips by a Decision Tree-B..:

, In: 2022 IEEE International Test Conference (ITC),
Cheng, Ya-Chi ; Tan, Pai-Yu ; Wu, Cheng-Wen... - p. 601-608 , 2022
 
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10

A Decision Tree-Based Screening Method for Improving Test Q..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Cheng, Ya-Chi ; Tan, Pai-Yu ; Wu, Cheng-Wen... - p. 19-24 , 2022
 
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13

Fault Modeling and Testing of Memristor-Based Spiking Neura..:

, In: 2022 IEEE International Test Conference (ITC),
Hou, Kuan-Wei ; Cheng, Hsueh-Hung ; Tung, Chi.. - p. 92-99 , 2022
 
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14

Battery Pack Reliability and Endurance Enhancement for Elec..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Chou, Yu-You ; Wu, Cheng-Wen ; Shieh, Ming-Der. - p. 66-71 , 2022
 
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15

A Thermal Quorum Sensing Scheme for Enhancement of Integrat..:

, In: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
 
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