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2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
1
A Built-In Self-Calibration Scheme for Memristor-Based Spik..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
2
Effective and Efficient Testing of Large Numbers of Inter-D..:
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2023 IEEE International 3D Systems Integration Conference (3DIC) ,
4
Effective and Efficient Test and Diagnosis Pattern Generati..:
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Proceedings of the 28th Asia and South Pacific Design Automation Conference ,
5
A Low-Bitwidth Integer-STBP Algorithm for Efficient Trainin..:
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2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
6
A Memory Built-In Peer-Repair Architecture for Mesh-Connect..:
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2022 IEEE International Test Conference (ITC) ,
7
Improving Test Quality of Memory Chips by a Decision Tree-B..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
8
Aging Impact of Power MOSFETs in Charger with Different Ope..:
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2022 IEEE International Test Conference in Asia (ITC-Asia) ,
10
A Decision Tree-Based Screening Method for Improving Test Q..:
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2022 IEEE International Test Conference (ITC) ,
13
Fault Modeling and Testing of Memristor-Based Spiking Neura..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
14
Battery Pack Reliability and Endurance Enhancement for Elec..:
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2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
15