Wu, Jui-Sheng
4026  Ergebnisse:
Personensuche X
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1

The Effect of Fluorine Doping in the Charge Trapping Layer ..:

Yang, Tsung-Ying ; Wu, Sih-Rong ; Wu, Jui-Sheng...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3603-3608 , 2024
 
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2

High-Temperature TDDB Investigation on High Performance-Cen..:

Rathaur, Shivendra K. ; Wu, Jui-Sheng ; Yang, Tsung-Ying...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4584-4590 , 2023
 
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3

Exploring Next-Generation GaN Power Devices with Ferroelect..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
 
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6

Hot Carrier Injection (HCI) Reliability of Fabricated Y-gat..:

Chen, Yu-Lin ; Yeh, Wen-Kuan ; Chen, Ke-Horng...
ECS Journal of Solid State Science and Technology.  12 (2023)  3 - p. 035001 , 2023
 
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8

Hf-Based and Zr-Based Charge Trapping Layer Engineering for..:

Wu, Jui-Sheng ; Lee, Chih-Chieh ; Wu, Chia-Hsun...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 525-531 , 2022
 
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10

AlN Passivation Technique for Ultra-Thin Barrier GaN Power ..:

, In: 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA),
 
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