Wu, Ken
2411  Ergebnisse:
Personensuche X
?
2

CMOS image sensor with nano light pillars for optical perfo..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
?
4

ID: 207378 Prospective Evaluation of the Effect of Differen..:

White, Thomas ; Justiz, Rafael ; Fishman, Michael...
Neuromodulation: Technology at the Neural Interface.  26 (2023)  4 - p. S31-S32 , 2023
 
?
5

Cryo-FIB and Synchrotron SAXS/WAXS Studies of Confined Crys..:

Subramanian, Vivek ; Wu, Ken ; Feng, Xueyan...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 523-525 , 2023
 
?
6

Health-related quality of life outcomes associated with zan..:

Tam, Constantine S. ; Lamanna, Nicole ; O'Brien, Susan M....
Current Medical Research and Opinion.  39 (2023)  11 - p. 1497-1503 , 2023
 
?
7

Construction of ITIL Intelligent Platform for Management of..:

, In: 2022 International Conference on Edge Computing and Applications (ICECAA),
Wu, Ken - p. 225-228 , 2022
 
?
8

Self-contact Introduced Passive Intermodulation Characteriz..:

, In: 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium,
Li, Jiangshuai ; Xia, Shengxuan ; Xu, Zhifei... - p. 929-934 , 2021
 
?
9

Afraid together:

Wu, Ken
The Lancet.  397 (2021)  10272 - p. 366-367 , 2021
 
?
11

RFI Estimation for Multiple Noise Sources Due to Modulation..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
 
?
12

A Correlative Imaging Approach for Extracellular Matrix Cha..:

Liu, Yifei ; Lee, Yong-Ung ; Yi, Tai...
Microscopy and Microanalysis.  25 (2019)  S2 - p. 1134-1135 , 2019
 
?
 
?
14

Effect of trench edge on pMOSFET reliability:

Lee, Yung-Huei ; Linton, Tom ; Wu, Ken.
Microelectronics Reliability.  41 (2001)  5 - p. 689-696 , 2001
 
1-15