Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Xama, Nektar
12  Ergebnisse:
Personensuche X
?
1

High-coverage analog IP block test generation methodology u..:

, In: 2023 IEEE European Test Symposium (ETS),
Gomez, Jhon ; Xama, Nektar ; Coyette, Anthony... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
?
2

Boosting Latent Defect Coverage in Automotive Mixed-Signal ..:

Xama, Nektar ; Gomez, Jhon ; Dobbelaere, Wim...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  10 - p. 3426-3435 , 2023
Link: https://doi.org/10.1109/..
 
?
3

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Si..:

Gomez, Jhon ; Xama, Nektar ; Coyette, Anthony...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  41 (2022)  11 - p. 4771-4781 , 2022
Link: https://doi.org/10.1109/..
 
?
4

Experimental Validation of a Compact Pinhole Latent Defect ..:

Gomez, Jhon ; Xama, Nektar ; Lootens, Dirk...
IEEE Transactions on Electron Devices.  69 (2022)  9 - p. 4796-4802 , 2022
Link: https://doi.org/10.1109/..
 
?
5

Machine Learning-based Defect Coverage Boosting of Analog C..:

Xama, Nektar ; Andraud, Martin ; Gomez, Jhon...
ACM Transactions on Design Automation of Electronic Systems (TODAES).  25 (2020)  5 - p. 1-27 , 2020
Link: https://dl.acm.org/doi/1..
 
?
6

Pinhole Latent Defect Modeling and Simulation for Defect-Or..:

, In: 2020 IEEE 38th VLSI Test Symposium (VTS),
Gomez, Jhon ; Xama, Nektar ; Coyette, Anthony... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
?
7

Latent Defect Screening with Visually-Enhanced Dynamic Part..:

, In: 2020 IEEE European Test Symposium (ETS),
Coyette, Anthony ; Dobbelaere, Wim ; Vanhooren, Ronny... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
?
8

Quick Analyses for Improving Reliability and Functional Saf..:

, In: 2020 IEEE International Test Conference (ITC),
Sunter, Stephen ; Wolinski, Michal ; Coyette, Anthony... - p. 1-10 , 2020
Link: https://doi.org/10.1109/..
 
?
9

Avoiding Mixed-Signal Field Returns by Outlier Detection of..:

, In: 2020 IEEE European Test Symposium (ETS),
Xama, Nektar ; Raymaekers, Jakob ; Andraud, Martin... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
?
10

Machine Learning-based Defect Coverage Boosting of Analog C..:

Xama, Nektar ; Andraud, Martin ; Gomez, Jhon...
ACM Transactions on Design Automation of Electronic Systems.  25 (2020)  5 - p. 1-27 , 2020
Link: https://doi.org/10.1145/..
 
?
11

Applying Vstress and defect activation coverage to produce ..:

, In: 2019 IEEE International Test Conference (ITC),
Dobbelaere, Wim ; Colle, Frederik ; Coyette, Anthony... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
?
12

Machine Learning-based Defect Coverage Boosting of Analog C..:

Xama, Nektar ; Andraud, Martin ; Gomez, Jhon...
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS.  , 2020
Link: https://aaltodoc.aalto.f..
 
1-12