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Xiao-Hua, Ma
46460  Ergebnisse:
Personensuche X
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1

The Anomalous Effect of Interface Traps on Generation Curre..:

Xiao-Hua, Ma ; Hai-Xia, Gao ; Yan-Rong, Cao..
Chinese Physics Letters.  27 (2010)  5 - p. 057301 , 2010
Link: https://doi.org/10.1088/..
 
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2

Characteristics in AlN/AlGaN/GaN Multilayer-Structured High..:

Gui-Zhou, Hu ; Ling, Yang ; Li-Yuan, Yang...
Chinese Physics Letters.  27 (2010)  8 - p. 087302 , 2010
Link: https://doi.org/10.1088/..
 
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3

Degradation of AlGaN/GaN High Electron Mobility Transistors..:

Ling, Yang ; Jing-Jing, Ma ; Cheng, Zhu..
Chinese Physics Letters.  27 (2010)  2 - p. 027102 , 2010
Link: https://doi.org/10.1088/..
 
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4

AlGaN/GaN MIS-HEMT using NbAlO dielectric layer grown by at..:

Zhi-Wei, Bi ; Qian, Feng ; Yue, Hao...
Chinese Physics B.  19 (2010)  7 - p. 077303 , 2010
Link: https://doi.org/10.1088/..
 
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5

Electric-stress reliability and current collapse of differe..:

Ling, Yang ; Gui-Zhou, Hu ; Yue, Hao...
Chinese Physics B.  19 (2010)  4 - p. 047301 , 2010
Link: https://doi.org/10.1088/..
 
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6

The study on mechanism and model of negative bias temperatu..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics B.  19 (2010)  9 - p. 097306 , 2010
Link: https://doi.org/10.1088/..
 
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7

Effect of Channel Length and Width on NBTI in Ultra Deep Su..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics Letters.  27 (2010)  3 - p. 037301 , 2010
Link: https://doi.org/10.1088/..
 
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8

Study on the drain bias effect on negative bias temperature..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics B.  19 (2010)  4 - p. 047307 , 2010
Link: https://doi.org/10.1088/..
 
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9

Various Recipes of SiNxPassivated AlGaN/GaN High Electron M..:

Ling, Yang ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics Letters.  26 (2009)  11 - p. 117104 , 2009
Link: https://doi.org/10.1088/..
 
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10

Study on the degradation of NMOSFETs with ultra-thin gate o..:

Shi-Gang, Hu ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics B.  18 (2009)  12 - p. 5479-5484 , 2009
Link: https://doi.org/10.1088/..
 
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11

High-electric-field-stress-induced degradation of SiN passi..:

Wen-Ping, Gu ; Huan-Tao, Duan ; Jin-Yu, Ni...
Chinese Physics B.  18 (2009)  4 - p. 1601-1608 , 2009
Link: https://doi.org/10.1088/..
 
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12

Hot-Carrier Stress Effects on GIDL and SILC in 90nm LDD-MOS..:

Shi-Gang, Hu ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics Letters.  26 (2009)  1 - p. 017304 , 2009
Link: https://doi.org/10.1088/..
 
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13

Effect of substrate bias on negative bias temperature insta..:

Yan-Rong, Cao ; Yue, Hao ; Xiao-Hua, Ma.
Chinese Physics B.  18 (2009)  1 - p. 309-314 , 2009
Link: https://doi.org/10.1088/..
 
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14

Effects of Different Plasma Energy Treatments on n-Type Al0..:

Ling, Yang ; Yue, Hao ; Xiao-Wei, Zhou.
Chinese Physics Letters.  26 (2009)  7 - p. 077105 , 2009
Link: https://doi.org/10.1088/..
 
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15

Mechanism of NBTI Recovery under Negative Voltage Stress:

Yan-Rong, Cao ; Shi-Gang, Hu ; Xiao-Hua, Ma.
Chinese Physics Letters.  25 (2008)  9 - p. 3393-3396 , 2008
Link: https://doi.org/10.1088/..
 
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