Yamane, K.
1053  Ergebnisse:
Personensuche X
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4

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
 
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5

Coherent Quench of Superconducting State Using Optical Vort..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Toda, Y. ; Tsuchiya, S. ; Yamane, K.... - p. 1-2 , 2022
 
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6

Development of a Laser Frequency Stabilization and an Optic..:

Nakamura, K ; Nagase, S ; Nakashita, T...
Journal of Physics: Conference Series.  2249 (2022)  1 - p. 012010 , 2022
 
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7

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
 
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8

Quantum sensing of the electron electric dipole moment usin..:

Aoki, T ; Sreekantham, R ; Sahoo, B K...
Quantum Science and Technology.  6 (2021)  4 - p. 044008 , 2021
 
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9

Immune complexome analysis reveals the presence of immune c..:

Yamane, K ; Nakamura, H ; Hamasaki, M...
Clinical and Experimental Immunology.  204 (2021)  2 - p. 212-220 , 2021
 
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10

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
 
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11

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
 
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13

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
 
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14

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020
 
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15

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
 
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