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Yamasue, Kohei
44  Ergebnisse:
Personensuche X
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1

Correlation analysis on local capacitance-voltage profiles ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Yamasue, Kohei ; Cho, Yasuo - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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2

Local capacitance-voltage profiling on MoS2/SiO2 and MoS2/h..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Ishizuka, Taiyo ; Yamasue, Kohei ; Cho, Yasuo - p. 223-225 , 2022
Link: https://doi.org/10.1109/..
 
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3

Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interf..:

Ogata, Yu ; Yamasue, Kohei ; Zhang, Xufang...
Materials Science Forum.  1062 (2022)  - p. 298-303 , 2022
Link: https://doi.org/10.4028/..
 
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4

Local capacitance-voltage profiling and deep level transien..:

Yamasue, Kohei ; Cho, Yasuo
Microelectronics Reliability.  135 (2022)  - p. 114588 , 2022
Link: https://doi.org/10.1016/..
 
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5

Surface Potential Fluctuations of SiO2/SiC Interfaces Inves..:

Yamasue, Kohei ; Cho, Yasuo
Materials Science Forum.  1062 (2022)  - p. 335-340 , 2022
Link: https://doi.org/10.4028/..
 
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6

Boxcar Averaging Scanning Nonlinear Dielectric Microscopy:

Yamasue, Kohei ; Cho, Yasuo
Nanomaterials.  12 (2022)  5 - p. 794 , 2022
Link: https://doi.org/10.3390/..
 
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7

Carrier profile mapping in a 3D Flash memory cell using sca..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Hirota, Jun ; Hoshino, Ken ; Yamasue, Kohei. - p. 375-377 , 2022
Link: https://doi.org/10.1109/..
 
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8

Nanoscale capacitance-voltage profiling of DC bias induced ..:

Suzuki, Koharu ; Yamasue, Kohei ; Cho, Yasuo
Microelectronics Reliability.  126 (2021)  - p. 114278 , 2021
Link: https://doi.org/10.1016/..
 
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9

Influence of Non-Uniform Interface Defect Clustering on Fie..:

Yamasue, Kohei ; Yamagishi, Yuji ; Cho, Yasuo
Materials Science Forum.  1004 (2020)  - p. 627-634 , 2020
Link: https://doi.org/10.4028/..
 
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10

Atomic Resolution Studies on Surface Dipoles by Noncontact ..:

, In: 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF),
Yamasue, Kohei ; Cho, Yasuo - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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11

Spatially-Resolved Evaluation of Interface Defect Density o..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Hosaka, Anna ; Yamasue, Kohei ; Woerle, Judith... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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12

A Study on Evaluation of Interface Defect Density on High-K..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Suzuki, Koharu ; Yamasue, Kohei ; Cho, Yasuo - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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13

Boxcar Averaging Based Scanning Nonlinear Dielectric Micros..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Yamasue, Kohei ; Cho, Yasuo - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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14

Two-dimensional defect mapping of the SiO2/4H−SiC interface:

Woerle, Judith ; Johnson, Brett C. ; Bongiorno, Corrado...
Physical Review Materials.  3 (2019)  8 - p. , 2019
Link: https://doi.org/10.1103/..
 
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15

Local carrier distribution imaging on few-layer MoS2 exfoli..:

Yamasue, Kohei ; Cho, Yasuo
Applied Physics Letters.  112 (2018)  24 - p. , 2018
Link: https://doi.org/10.1063/..
 
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