Yang, Ji Chul
10784  Ergebnisse:
Personensuche X
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1

Post Cleaning for FEOL CMP with Silica and Ceria Slurries:

Tseng, Wei-Tsu ; Wu, Changhong ; McCormack, Tim.
ECS Journal of Solid State Science and Technology.  6 (2017)  10 - p. P718-P722 , 2017
 
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3

Study of sol-gel type ceria particle for CMP process in lea..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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5

Effective surface design for reduced scratches on CMP:

, In: Proceedings of International Conference on Planarization/CMP Technology 2014,
 
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6

Experimental Evaluation of the Effect of Pad Debris Size on..:

Yang, Ji Chul ; Kim, Hojoong ; Oh, Dong Won...
Journal of Electronic Materials.  42 (2012)  1 - p. 97-102 , 2012
 
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7

Frictional Characteristic of Polymeric Additive for the Slu..:

Kim, Hojoong ; Yang, Ji Chul ; Lee, Junwye...
ECS Journal of Solid State Science and Technology.  1 (2012)  3 - p. P101-P106 , 2012
 
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9

Measurement of CMP Slurry Abrasive Size Distribution by Sca..:

Kim, Hojoong ; Yang, Ji Chul ; Kim, Taesung
Electrochemical and Solid-State Letters.  13 (2010)  4 - p. H137 , 2010
 
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10

Investigation on Surface Hardening of Polyurethane Pads Dur..:

Yang, Ji Chul ; Oh, Dong Won ; Kim, Ho Joong.
Journal of Electronic Materials.  39 (2010)  3 - p. 338-346 , 2010
 
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12

Effects of diamond size of CMP conditioner on wafer removal..:

Chul Yang, Ji ; Hoon Choi, Joo ; Hwang, Taewook..
International Journal of Machine Tools and Manufacture.  50 (2010)  10 - p. 860-868 , 2010
 
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15

Impact of Workforce Interprofessional Education and Telehea..:

Yang, Hee Chul ; Kim, Laurie ; Yoo, Ji
Journal of Pain and Symptom Management.  65 (2023)  3 - p. e255-e256 , 2023
 
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