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Yang, Yeongheon
7  Ergebnisse:
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1

Reliability Improvement in Vertical NAND Flash Cells Using ..:

Park, Sung-Ho ; Yoo, Ho-Nam ; Yang, Yeongheon..
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1834-1838 , 2024
Link: https://doi.org/10.1109/..
 
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2

On-Chip Learning in Vertical NAND Flash Memory Using Forwar..:

Park, Sung-Ho ; Ko, Jonghyun ; Lee, In-Seok...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3640-3644 , 2024
Link: https://doi.org/10.1109/..
 
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3

Accurate SPICE Model for Cells With Tube-Type Poly-Si Chann..:

Hwang, Joon ; Yoo, Ho-Nam ; Lee, Kyu-Ho...
IEEE Transactions on Electron Devices.  70 (2023)  10 - p. 5469-5474 , 2023
Link: https://doi.org/10.1109/..
 
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4

In‐Memory‐Computed Low‐Frequency Noise Spectroscopy for Sel..:

Shin, Wonjun ; Kim, Jaehyeon ; Jung, Gyuweon...
Advanced Science.  10 (2023)  7 - p. , 2023
Link: https://doi.org/10.1002/..
 
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5

Voltage scheme for string-select transistors to improve inh..:

Park, Sung-Ho ; Yoo, Ho-Nam ; Yang, Yeongheon...
Applied Physics Letters.  123 (2023)  14 - p. , 2023
Link: https://doi.org/10.1063/..
 
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6

Retention Improvement in Vertical NAND Flash Memory Using 1..:

, In: 2022 International Electron Devices Meeting (IEDM),
Park, Sung-Ho ; Kwon, Dongseok ; Yoo, Ho-Nam... - p. 5.5.1-5.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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7

In‐Memory‐Computed Low‐Frequency Noise Spectroscopy for Sel..:

Wonjun Shin ; Jaehyeon Kim ; Gyuweon Jung...
https://doi.org/10.1002/advs.202205725.  , 2023
Link: https://doi.org/10.1002/..
 
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