E-LIB Suche - Ergebnisse für: Yarmolik, V. N.

1

Synthesis of Test Sequences with a Given Switching Activity:

Yarmolik, V. N. ; Shevchenko, N. A.
Automation and Remote Control. 83 (2022) 2 - p. 291-302 , 2022

Link: https://doi.org/10.1134/..

2

Controlled method of random test synthesis:

Yarmolik, V. N. ; Mrozek, I. ; Yarmolik, S. V.
Automatic Control and Computer Sciences. 49 (2015) 6 - p. 395-403 , 2015

Link: https://doi.org/10.3103/..

3

Address sequences:

Yarmolik, V. N. ; Yarmolik, S. V.
Automatic Control and Computer Sciences. 48 (2014) 4 - p. 207-213 , 2014

Link: https://doi.org/10.3103/..

4

Generating modified Sobol sequences for multiple run march ..:

Yarmolik, V. N. ; Yarmolik, S. V.
Automatic Control and Computer Sciences. 47 (2013) 5 - p. 242-247 , 2013

Link: https://doi.org/10.3103/..

5

Controlled random tests:

Yarmolik, S. V. ; Yarmolik, V. N.
Automation and Remote Control. 73 (2012) 10 - p. 1704-1714 , 2012

Link: https://doi.org/10.1134/..

6

The synthesis of probability tests with a small number of k..:

Yarmolik, S. V. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 45 (2011) 3 - p. 133-141 , 2011

Link: https://doi.org/10.3103/..

7

Generalized adaptive signature analysis:

Yarmolik, S. V. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 44 (2010) 4 - p. 227-233 , 2010

Link: https://doi.org/10.3103/..

8

Nondestructive RAM testing based on multiple signature comp..:

Yarmolik, S. V. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 43 (2009) 4 - p. 173-178 , 2009

Link: https://doi.org/10.3103/..

9

Determination of the optimal initial states for multiple-ru..:

Yarmolik, S. V. ; Kurbatskii, A. N. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 42 (2008) 3 - p. 120-125 , 2008

Link: https://doi.org/10.3103/..

10

A new approach to the design of built-in internal memory se..:

Ivanyuk, A. A. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 42 (2008) 4 - p. 169-174 , 2008

Link: https://doi.org/10.3103/..

11

The repeated nondestructive march tests with variable addre..:

Yarmolik, V. N. ; Yarmolik, S. V.
Automation and Remote Control. 68 (2007) 4 - p. 688-698 , 2007

Link: https://doi.org/10.1134/..

12

Injection of functional faults in VHDL-description of digit..:

Ivanyuk, A. A. ; Yarmolik, V. N.
Automatic Control and Computer Sciences. 41 (2007) 3 - p. 119-125 , 2007

Link: https://doi.org/10.3103/..

13

Detecting multiple errors in RAM by Self-Adjusting output d..:

Ivaniuk, A. A. ; Musin, S. B. ; Yarmolik, V. N.
Russian Microelectronics. 36 (2007) 4 - p. 271-277 , 2007

Link: https://doi.org/10.1134/..

14

Pseudorandom Test Pattern Generators for Built-in Self-Test..:

Murashko, I. A. ; Yarmolik, V. N.
Automation and Remote Control. 65 (2004) 8 - p. 1265-1275 , 2004

Link: https://doi.org/10.1023/..

15

Symmetric transparent BIST for RAMs:

, In: Proceedings of the conference on Design, automation and test in Europe,

Hellebrand, S. ; Wunderlich, H.-J. ; Yarmolik, V. N. - p. 135-es , 1999

Link: https://dl.acm.org/doi/1..