E-LIB Suche - Ergebnisse für: Yarykin, Nikolai A

1

Radiation defects as probes for the copper and nickel conta..:

Yarykin, Nikolai ; Weber, Jörg
Materials Science in Semiconductor Processing. 169 (2024) - p. 107938 , 2024

Link: https://doi.org/10.1016/..

2

Electrical Activation of Interstitial Ni in Cu‐Doped Si:

Yarykin, Nikolai ; Weber, Jörg
physica status solidi (a). 218 (2021) 23 - p. , 2021

Link: https://doi.org/10.1002/..

3

Copper Complexes with Carbon‐Related Radiation Defects in S..:

Yarykin, Nikolai ; Weber, Jörg ; Lastovskii, Stanislau.
physica status solidi (a). 218 (2021) 23 - p. , 2021

Link: https://doi.org/10.1002/..

4

Room‐Temperature Ni Interaction with Deformation‐Induced De..:

Soltanovich, Oleg A. ; Orlov, Valery I. ; Yarykin, Nikolai.
physica status solidi (a). 216 (2019) 17 - p. , 2019

Link: https://doi.org/10.1002/..

5

Electrically Active Copper–Nickel Complexes in p‐Type Silic..:

Yarykin, Nikolai ; Weber, Jörg
physica status solidi (a). 216 (2019) 17 - p. , 2019

Link: https://doi.org/10.1002/..

6

Nickel Interaction with Vacancy‐Type Radiation Defects in S..:

Yarykin, Nikolai ; Lastovskii, Stanislau ; Weber, Jörg
physica status solidi (RRL) – Rapid Research Letters. 13 (2019) 5 - p. , 2019

Link: https://doi.org/10.1002/..

7

Evidence for room-temperature in-diffusion of nickel into s..:

Yarykin, Nikolai ; Weber, Jörg
Applied Physics Letters. 109 (2016) 10 - p. , 2016

Link: https://doi.org/10.1063/..

8

Spatial Distribution of the Dislocation Trails in Silicon:

Orlov, V.I. ; Yakimov, E.B. ; Yarykin, Nikolai
Solid State Phenomena. 242 (2015) - p. 155-159 , 2015

Link: https://doi.org/10.4028/..

9

Interstitial Carbon in p-Type Copper-Doped Silicon:

Yarykin, Nikolai ; Weber, Jörg
Solid State Phenomena. 242 (2015) - p. 302-307 , 2015

Link: https://doi.org/10.4028/..

10

Interaction of Interstitial Copper with Isolated Vacancies ..:

Yarykin, Nikolai ; Weber, Jörg
Solid State Phenomena. 242 (2015) - p. 308-311 , 2015

Link: https://doi.org/10.4028/..

11

Hydrogenation of the CuPL center in silicon:

Yarykin, Nikolai ; Weber, Jörg
Applied Physics Letters. 105 (2014) 1 - p. , 2014

Link: https://doi.org/10.1063/..

12

Deep levels of copper-hydrogen complexes in silicon:

Yarykin, Nikolai ; Weber, Jörg
Physical Review B. 88 (2013) 8 - p. , 2013

Link: https://doi.org/10.1103/..

13

Copper-related deep-level centers in irradiatedp-type silic..:

Yarykin, Nikolai ; Weber, Jörg
Physical Review B. 83 (2011) 12 - p. , 2011

Link: https://doi.org/10.1103/..

14

DLTS study of the oxygen dimer formation kinetics in silico:

Yarykin, Nikolai ; Weber, Jörg
Physica B: Condensed Matter. 404 (2009) 23-24 - p. 4576-4578 , 2009

Link: https://doi.org/10.1016/..

15

Minority-carrier-enhanced dissociation of the boron–hydroge..:

Yarykin, Nikolai
Physica B: Condensed Matter. 404 (2009) 23-24 - p. 5093-5095 , 2009

Link: https://doi.org/10.1016/..