Ye, Jeff
319  Ergebnisse:
Personensuche X
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1

Defect Reduction And Line Width Roughness (LWR) improvement..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Pagadala, Raviteja ; Lu, Fei - p. 01-04 , 2024
 
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2

Elimination of Bond Pad Etch Induced Wafer Arcing via Reduc..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Lien, Wan-Ping ; Lee, Ocean. - p. 1-4 , 2024
 
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3

In-Situ Post Etch Fluorocarbon Byproduct Removal for HDP Vo..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Bharatan, Prabhakar ; Ye, Jeff J. ; Webb, Brad... - p. 1-5 , 2024
 
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4

Cloud Big Data Lake for Advanced Analytics in Semiconductor..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Sun, Susan ; Ye, Jeff ; Schwarthoff, Hubert... - p. 1-5 , 2024
 
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5

Process Margin Improvement and Cost Saving from a New Plasm..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Smith, Todd ; Liew, Alex... - p. 1-4 , 2024
 
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6

Elimination of Pinhole Defects in Self-Aligned Double Patte..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Lien, Wan-Ping ; Ye, Jeff J. ; Wu, You-Shen.. - p. 1-5 , 2024
 
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7

A Role of N2 and O2 Gasses in Post Etch Treatment (PET) for..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Lien, Wan-Ping ; Chen, San - p. 1-5 , 2023
 
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8

A Novel Continuous Plasma Etch with Optimized Algorithms fo..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Lu, Fei ; Sheng, Haifeng. - p. 1-5 , 2023
 
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9

Control Gate Device Leakage Reduction by Improving Polysili..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ye, Jeff J. ; Wu, Meng-Yin ; Liu, Hank - p. 1-5 , 2023
 
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10

Continuous plasma etch process with waferless chamber clean..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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13

Characteristics of rat downregulated in adenoma (rDRA) expr..:

Barmeyer, Christian ; Ye, Jeff Huaqing ; Sidani, Shafik...
Pflügers Archiv - European Journal of Physiology.  454 (2007)  3 - p. 441-450 , 2007
 
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