Yildirim, G.
1440  Ergebnisse:
Personensuche X
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1

Evolution of fundamental mechanical properties with alioval..:

Ozturk, O. ; Safran, S. ; Ada, H....
Journal of Materials Science: Materials in Electronics.  35 (2024)  15 - p. , 2024
 
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4

Evolution of basic features of Bi1.8Pb0.4Sr2Ca2.2Cu3Oy cera..:

Kara, E. ; Doğan, M. U. ; Kaya, Ş....
Journal of Materials Science: Materials in Electronics.  34 (2023)  19 - p. , 2023
 
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6

Evaluation of superconducting features and gap coefficients..:

Kaya, N. ; Cavdar, S. ; Ozturk, O...
Journal of Materials Science: Materials in Electronics.  33 (2022)  7 - p. 3786-3800 , 2022
 
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7

Effect of Nd/Sr Partial Replacement on Characteristic Bi-22..:

Dogruer, M. ; Yildirim, G. ; Terzioglu, C.
Journal of Superconductivity and Novel Magnetism.  35 (2022)  10 - p. 2765-2775 , 2022
 
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8

Role of active slip systems induced with holmium impurity i..:

Ulgen, A.T. ; Çetin, Samet ; Zalaoglu, Y....
Ceramics International.  48 (2022)  18 - p. 26361-26369 , 2022
 
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9

Refinement of some basic features of Zr surface-layered Bi-..:

Orhan, E. ; Kara, E. ; Kaya, Ş....
Journal of Materials Science: Materials in Electronics.  33 (2022)  26 - p. 20696-20712 , 2022
 
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10

Examination of pairing mechanism, orbital hybridization, st..:

Ozturk, O. ; Guducu, G. ; Safran, S..
Journal of Alloys and Compounds.  924 (2022)  - p. 166362 , 2022
 
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12

Evaluation of crystallographic and electrical-superconducti..:

Akkurt, B. ; Erdem, U. ; Zalaoglu, Y....
Journal of Materials Science: Materials in Electronics.  32 (2021)  4 - p. 5035-5049 , 2021
 
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13

Effect of annealing ambient conditions on crack formation m..:

Erdem, U. ; Akkurt, B. ; Ulgen, A.T....
Journal of Asian Ceramic Societies.  9 (2021)  3 - p. 1214-1227 , 2021
 
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14

DFT, Molecular Docking and Drug-likeness Analysis: Acrylate..:

Soykan, U. ; Sert, Y. ; Yıldırım, G.
Journal of Molecular Structure.  1244 (2021)  - p. 130940 , 2021
 
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15

Improvement in fundamental electronic properties of Bi-2212..:

Zalaoglu, Y. ; Erdem, U. ; Bolat, F. C....
Journal of Materials Science: Materials in Electronics.  32 (2021)  14 - p. 19846-19858 , 2021
 
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