E-LIB Suche - Ergebnisse für: You, Yebin

1

Enhancement of Ar Ion Flux on the Substrate by Heterogeneou..:

Seong, Inho ; Kim, Sijun ; Choi, Minsu...
Materials. 16 (2023) 17 - p. 5746 , 2023

Link: https://doi.org/10.3390/..

2

Characterization of SiO2 Plasma Etching with Perfluorocarbo..:

Choi, Minsu ; Lee, Youngseok ; You, Yebin...
Materials. 16 (2023) 16 - p. 5624 , 2023

Link: https://doi.org/10.3390/..

3

Determination of Plasma Potential Using an Emissive Probe w..:

Cho, Chulhee ; Kim, Sijun ; Lee, Youngseok...
Materials. 16 (2023) 7 - p. 2762 , 2023

Link: https://doi.org/10.3390/..

4

Contribution of Ion Energy and Flux on High-Aspect Ratio Si..:

Jeong, Wonnyoung ; Kim, Sijun ; Lee, Youngseok...
Materials. 16 (2023) 10 - p. 3820 , 2023

Link: https://doi.org/10.3390/..

5

Computational Analysis on Self-Resonance Frequency of Solen..:

Choi, Min-Su ; Kim, Si-Jun ; Lee, Young-Seok...
Applied Science and Convergence Technology. 32 (2023) 2 - p. 54-57 , 2023

Link: https://doi.org/10.5757/..

6

On the Quenching of Electron Temperature in Inductively Cou..:

Seong, Inho ; Kim, Si-jun ; Lee, Youngseok...
Materials. 16 (2023) 8 - p. 3219 , 2023

Link: https://doi.org/10.3390/..

7

Characterization of an Etch Profile at a Wafer Edge in Capa..:

Seong, Inho ; Lee, Jinho ; Kim, Sijun...
Nanomaterials. 12 (2022) 22 - p. 3963 , 2022

Link: https://doi.org/10.3390/..

8

Comprehensive Assessments in Bonding Energy of Plasma Assis..:

Lee, Youngseok ; You, Yebin ; Cho, Chulhee...
Micromachines. 13 (2022) 11 - p. 1856 , 2022

Link: https://doi.org/10.3390/..

9

Safety of Chamber Exterior Wall Ground:

You, Ye-Bin ; Kim, Si-Jun ; Lee, Young-Seok...
Applied Science and Convergence Technology. 31 (2022) 5 - p. 103-106 , 2022

Link: https://doi.org/10.5757/..

10

Development of the Measurement of Lateral Electron Density ..:

Kim, Si-jun ; Lee, Sang-ho ; You, Ye-bin...
Sensors. 22 (2022) 15 - p. 5487 , 2022

Link: https://doi.org/10.3390/..

11

Development of a Noninvasive Real-Time Ion Energy Distribut..:

Seong, Inho ; Kim, Sijun ; Lee, Youngseok...
Sensors. 22 (2022) 16 - p. 6254 , 2022

Link: https://doi.org/10.3390/..

12

Influence of Additive N2 on O2 Plasma Ashing Process in Ind..:

You, Ye-Bin ; Lee, Young-Seok ; Kim, Si-Jun...
Nanomaterials. 12 (2022) 21 - p. 3798 , 2022

Link: https://doi.org/10.3390/..

13

Refined Appearance Potential Mass Spectrometry for High Pre..:

Cho, Chulhee ; Kim, Sijun ; Lee, Youngseok...
Sensors. 22 (2022) 17 - p. 6589 , 2022

Link: https://doi.org/10.3390/..

14

Development of a High-Linearity Voltage and Current Probe w..:

Kim, Si-jun ; Seong, In-ho ; Lee, Young-seok...
Sensors. 22 (2022) 15 - p. 5871 , 2022

Link: https://doi.org/10.3390/..

15

Determination of Plasma Potential Using an Emissive Probe w..:

Cho, Chulhee ; Kim, Sijun ; Lee, Youngseok...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10095820/. , 2023

Link: http://www.ncbi.nlm.nih...