Young Kim, Soo
95707  Ergebnisse:
Personensuche X
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8

A 16 GB 1024 GB/s HBM3 DRAM with On-Die Error Control Schem..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Ryu, Yesin ; Kwon, Young-Cheon ; Lee, Jae Hoon... - p. 130-131 , 2022
 
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14

Low-resistance Ti/Al ohmic contact on undoped ZnO:

Young Kim, Soo ; Won Jang, Ho ; Kyu Kim, Jong...
Journal of Electronic Materials.  31 (2002)  8 - p. 868-871 , 2002
 
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