Young-Guon Kim, Young-Guon Kim
39  Ergebnisse:
Personensuche X
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3

Influence of Vacuum-Annealing Process on the Secondary Elec..:

Jeoung, Jin-Man ; Lim, Jae-Yong ; Kim, Young-Guon...
Japanese Journal of Applied Physics.  40 (2001)  3R - p. 1433 , 2001
 
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4

Striations in a coplanar ac-plasma display panel:

Cho, Guangsup ; Choi, Eun-Ha ; Kim, Young-Guon...
Journal of Applied Physics.  87 (2000)  9 - p. 4113-4118 , 2000
 
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5

Ion-Induced Secondary Electron Emission Coefficient (γ) of ..:

Kim, Dae-Il ; Lim, Jae-Yong ; Kim, Young-Guon...
Japanese Journal of Applied Physics.  39 (2000)  4R - p. 1890 , 2000
 
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6

Transition of Space Charge to Wall Charge by Control Pulse ..:

Ko, Jae-Jun ; Kim, Young-Guon ; Kim, Dae-Il...
Japanese Journal of Applied Physics.  39 (2000)  5R - p. 2825 , 2000
 
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7

Influence of Driving Frequency on the System Parameters in ..:

Choi, Eun-Ha ; Cho, Tae-Seung ; Cho, Dae-Sik...
Japanese Journal of Applied Physics.  38 (1999)  10R - p. 6073 , 1999
 
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8

Secondary electron emission coefficient of a MgO single cry..:

Choi, Eun-Ha ; Lim, Jae-Yong ; Kim, Young-Guon...
Journal of Applied Physics.  86 (1999)  11 - p. 6525-6527 , 1999
 
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10

Energy Distribution of Field Emitted Charged Particles duri..:

Cho, Guangsup ; Kim, Young-Guon ; Kim, Young-Sam.
Japanese Journal of Applied Physics.  37 (1998)  12S - p. 6797 , 1998
 
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11

Temperature effects on the energy spreads in liquid metal i..:

Kim, Young-Guon ; Kim, Young-Sam ; Choi, Eun-Ha...
Journal of Physics D: Applied Physics.  31 (1998)  24 - p. 3463-3468 , 1998
 
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12

Measurement of Secondary Electron Emission Coefficient (γ)o..:

Choi, Eun-Ha ; Oh, Hyun-Joo ; Kim, Young-Guon...
Japanese Journal of Applied Physics.  37 (1998)  12S - p. 7015 , 1998
 
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13

Influence of Inertial Force on Electron Trajectoriesin the ..:

Sam Kim, Young ; Guon Kim, Young ; Il Kim, Dai...
Japanese Journal of Applied Physics.  39 (2000)  7A - p. L684 , 2000
 
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14

Effects of the Dielectric Layer on a Planar and a Coplanar ..:

andGuangsup Cho, Young-Guon Kim
Japanese Journal of Applied Physics.  37 (1998)  12B - p. L1549 , 1998
 
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