E-LIB Suche - Ergebnisse für: Yu, Cheng-Hao

1

Impact of SiC power MOSFET interface trap charges on UIS re..:

Wu, Xiao-Dong ; Wang, Ying ; Yu, Cheng-Hao...
Microelectronics Reliability. 155 (2024) - p. 115375 , 2024

Link: https://doi.org/10.1016/..

2

Analysis and simulation of bulk polarization mechanism in p..:

Liu, Shijin ; Wang, Ying ; Fei, XinXing..
Semiconductor Science and Technology. , 2024

Link: https://doi.org/10.1088/..

3

Performance enhancement of 1.7 kV MOSFET using PIN-junction..:

Wang, Qing-yuan ; Wang, Ying ; Fei, Xin-Xing...
Microelectronics Reliability. 152 (2024) - p. 115305 , 2024

Link: https://doi.org/10.1016/..

4

Children with Duchenne muscular dystrophy display specific ..:

Wu, Kuan-Wen ; Yu, Cheng-Hao ; Huang, Tse-Hua...
Scientific Reports. 13 (2023) 1 - p. , 2023

Link: https://doi.org/10.1038/..

5

Simulation study on single-event burnout in field-plated Ga..:

Yu, Cheng-hao ; Guo, Hao-min ; Liu, Yan...
Microelectronics Reliability. 149 (2023) - p. 115227 , 2023

Link: https://doi.org/10.1016/..

6

Seismic dynamic stability of double-slider rock slopes cont..:

Zhu, Chen-hao ; Zhao, Lian-heng ; Hu, Shi-hong..
Journal of Mountain Science. 20 (2023) 7 - p. 2093-2106 , 2023

Link: https://doi.org/10.1007/..

7

Recurrent Neural Network Methods for Extracting Dynamic Bal..:

Yu, Cheng-Hao ; Yeh, Chih-Ching ; Lu, Yi-Fu...
Sensors. 23 (2023) 22 - p. 9040 , 2023

Link: https://doi.org/10.3390/..

8

Experimental and simulated investigation of −100 V rated P-..:

Wu, Xiao-dong ; Yu, Cheng-hao ; Liu, Yan.
Microelectronics Reliability. 151 (2023) - p. 115250 , 2023

Link: https://doi.org/10.1016/..

9

Analysis of radiation effect of a novel SOI-Like LDMOS stru..:

Yang, Yang ; Wang, Ying ; Yu, Cheng-Hao..
Microelectronics Reliability. 129 (2022) - p. 114471 , 2022

Link: https://doi.org/10.1016/..

10

TCAD evaluation of single-event burnout hardening design fo..:

Chen, Jia-Hao ; Wang, Ying ; Guo, Hao-min...
Microelectronics Reliability. 139 (2022) - p. 114865 , 2022

Link: https://doi.org/10.1016/..

11

Study of TID radiation effects on the breakdown voltage of ..:

Yu, Cheng-hao ; Bao, Meng-tian ; Guo, Hao-min.
Microelectronics Reliability. 139 (2022) - p. 114850 , 2022

Link: https://doi.org/10.1016/..

12

A Comparative Study on Heavy-Ion Irradiation Impact on p-Ch..:

Wang, Ying ; Yu, Cheng-Hao ; Li, Xing-Ji.
IEEE Transactions on Nuclear Science. 69 (2022) 6 - p. 1249-1256 , 2022

Link: https://doi.org/10.1109/..

13

Improved 4H-SiC UMOSFET with super-junction shield region*:

Shen, Pei ; Wang, Ying ; Li, Xing-Ji...
Chinese Physics B. 30 (2021) 5 - p. 058502 , 2021

Link: https://doi.org/10.1088/..

14

A High-Performance SiC Super-Junction MOSFET With a Step-Do..:

Huang, Hao ; Wang, Ying ; Yu, Cheng-Hao...
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 1084-1092 , 2021

Link: https://doi.org/10.1109/..

15

Simulation study of high voltage GaN MISFETs with embedded ..:

Fei, Xin-Xing ; Wang, Ying ; Luo, Xin.
Chinese Physics B. 29 (2020) 8 - p. 080701 , 2020

Link: https://doi.org/10.1088/..