Yu, Ji-Man
11837  Ergebnisse:
Personensuche X
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2

Physically Unclonable Function With a Rough Silicon Channel..:

Jung, Dae-Han ; Yu, Ji-Man ; Ku, Ja-Yun...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 425-430 , 2024
 
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3

Self-Curable Synaptor With Tri-Node Charge- Trap FinFET for..:

Yu, Ji-Man ; Ham, Gyeongdo ; Kim, Seong-Yeon...
IEEE Electron Device Letters.  45 (2024)  4 - p. 716-719 , 2024
 
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4

Leaky FinFET for Reservoir Computing with Temporal Signal P..:

Han, Joon-Kyu ; Yun, Seong-Yun ; Yu, Ji-Man.
ACS Applied Materials & Interfaces.  15 (2023)  22 - p. 26960-26966 , 2023
 
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5

Artificial Multisensory Neuron with a Single Transistor for..:

Han, Joon-Kyu ; Yun, Seong-Yun ; Yu, Ji-Man..
ACS Applied Materials & Interfaces.  15 (2023)  4 - p. 5449-5455 , 2023
 
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6

Vertically Integrated CMOS Ternary Logic Device with Low St..:

Han, Joon-Kyu ; Lee, Jung-Woo ; Kim, Young Bin...
ACS Applied Materials & Interfaces.  15 (2023)  44 - p. 51429-51434 , 2023
 
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7

Co-Integrated Neuromorphic Devices for Bio-Inspired Complia..:

Shin, Hery ; Yu, Ji-Man ; Han, Joon-Kyu.
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 706-712 , 2023
 
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8

Improved SOI FinFETs Performance With Low-Temperature Deute..:

Ku, Ja-Yun ; Yu, Ji-Man ; Wang, Dong-Hyun...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3958-3962 , 2023
 
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10

Triple-Node FinFET With Non-Ohmic Schottky Junctions for Sy..:

Yu, Ji-Man ; Kim, Seong-Yeon ; Kim, Jin-Ki...
IEEE Electron Device Letters.  44 (2023)  1 - p. 40-43 , 2023
 
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12

Error reduction of SRAM-based physically unclonable functio..:

Kim, Moon-Seok ; Kim, Sungho ; Yoo, Sang-Kyung...
International Journal of Information Security.  22 (2023)  5 - p. 1087-1098 , 2023
 
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13

Lowering of Schottky Barrier Height in a Vertical Pillar MO..:

Yu, Ji-Man ; Wang, Dong-Hyun ; Han, Joon-Kyu...
IEEE Electron Device Letters.  44 (2023)  7 - p. 1032-1035 , 2023
 
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14

Concealable Oscillation-Based Physical Unclonable Function ..:

Jung, Jin-Woo ; Han, Joon-Kyu ; Yu, Ji-Man...
IEEE Electron Device Letters.  43 (2022)  8 - p. 1359-1362 , 2022
 
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