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Yu, Renze
51  Ergebnisse:
Personensuche X
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1

Degradation Analysis of Planar, Symmetrical and Asymmetrica..:

Yu, Renze ; Jahdi, Saeed ; Mellor, Phil...
IEEE Transactions on Power Electronics.  38 (2023)  9 - p. 10933-10946 , 2023
Link: https://doi.org/10.1109/..
 
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2

Electrothermal Power Cycling to Failure of Discrete Planar,..:

Yang, Juefei ; Jahdi, Saeed ; Yu, Renze.
IEEE Open Journal of Power Electronics.  4 (2023)  - p. 887-899 , 2023
Link: https://doi.org/10.1109/..
 
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3

Measurements and Review of Failure Mechanisms and Reliabili..:

Yu, Renze ; Jahdi, Saeed ; Alatise, Olayiwola...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 544-563 , 2023
Link: https://doi.org/10.1109/..
 
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4

Unclamped inductive stressing of GaN and SiC Cascode power ..:

Gunaydin, Yasin ; Jahdi, Saeed ; Yuan, Xibo...
Microelectronics Reliability.  138 (2022)  - p. 114711 , 2022
Link: https://doi.org/10.1016/..
 
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5

Investigation of Repetitive Short Circuit Stress as a Degra..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
Yu, Renze ; Jahdi, Saeed ; Mellor, Phil... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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6

Thermal Contact Resistance Optimization of Press-Pack IGBT ..:

Wang, Xiao ; Li, Hui ; Yao, Ran...
IEEE Transactions on Power Electronics.  37 (2022)  5 - p. 5411-5421 , 2022
Link: https://doi.org/10.1109/..
 
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7

Impact of Electrothermal Bias Temperature Instability Stres..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
Gunaydin, Yasin ; Jahdi, Saeed ; Yuan, Xibo... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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8

FEM-based analysis of avalanche ruggedness of high voltage ..:

Shen, Chengjun ; Yu, Renze ; Jahdi, Saeed...
Microelectronics Reliability.  138 (2022)  - p. 114686 , 2022
Link: https://doi.org/10.1016/..
 
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9

Colorimetric quantification of aqueous hydrogen peroxide in..:

YU, Renze ; LIU, Zhaoyuan ; LIN, Jiao...
Plasma Science and Technology.  23 (2021)  5 - p. 055504 , 2021
Link: https://doi.org/10.1088/..
 
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10

Improved Temperature Estimation Model of 4H-SiC MOSFET unde..:

, In: 2020 4th International Conference on HVDC (HVDC),
Yu, Renze ; Li, Hui ; Zhong, Yi... - p. 874-879 , 2020
Link: https://doi.org/10.1109/..
 
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11

Study on the Method to Analyze the Electrical Contact Resis..:

, In: 2019 IEEE 21st Electronics Packaging Technology Conference (EPTC),
Wang, Xiao ; Li, Hui ; Yao, Ran... - p. 613-617 , 2019
Link: https://doi.org/10.1109/..
 
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12

Design of 400 V Miniature DC Solid State Circuit Breaker wi..:

Li, Hui ; Yu, Renze ; Zhong, Yi...
Micromachines.  10 (2019)  5 - p. 314 , 2019
Link: https://doi.org/10.3390/..
 
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13

Analysis on the Reliability Effect of Solder Voids on the N..:

, In: 2020 4th International Conference on HVDC (HVDC),
Renkuan, Liu ; Hul, Li ; Haiyang, Long... - p. 20-25 , 2020
Link: https://doi.org/10.1109/..
 
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14

Degradation Analysis of Planar, Symmetrical and Asymmetrica..:

Yu, Renze ; Jahdi, Saeed ; Mellor, Phil...
Yu , R , Jahdi , S , Mellor , P , Liu , L , Yang , J , Shen , C , Alatise , O & Ortiz-Gonzalez , J 2023 , ' Degradation Analysis of Planar, Symmetrical and Asymmetrical Trench SiC MOSFETs Under Repetitive Short Circuit Impulses ' , IEEE Transactions on Power Electronics , vol. 38 , no. 9 , pp. 10933-10946 . https://doi.org/10.1109/TPEL.2023.3290387.  , 2023
Link: https://hdl.handle.net/1..
 
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15

Electrothermal Power Cycling to Failure of Discrete Planar,..:

Yang, Juefei ; Jahdi, Saeed ; Yu, Renze.
Yang , J , Jahdi , S , Yu , R & Stark , B 2023 , ' Electrothermal Power Cycling to Failure of Discrete Planar, Symmetrical Double-Trench and Asymmetrical Trench SiC MOSFETs ' , IEEE Open Journal of Power Electronics , vol. 4 , pp. 887 - 899 . https://doi.org/10.1109/OJPEL.2023.3326909.  , 2023
Link: https://hdl.handle.net/1..
 
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