Yumeng, CAI
339  Ergebnisse:
Personensuche X
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1

A low stray inductance laminated busbar for series-parallel..:

Yannan, GUO ; Peng, SUN ; Yumeng, CAI.
Journal of Physics: Conference Series.  1750 (2021)  1 - p. 012014 , 2021
 
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3

Investigation on Gate Oxide Degradation of SiC MOSFET in Sw..:

Cai, Yumeng ; Sun, Peng ; Chen, Cong...
IEEE Transactions on Power Electronics.  39 (2024)  8 - p. 9565-9578 , 2024
 
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6

Paralleled Multi-Chip Current Sensing PCB Coils for SiC Pow..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),
Qu, Zelong ; Sun, Peng ; Qiao, Jianshen... - p. 4719-4723 , 2024
 
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7

Modeling of the Turn-Off Transient Process and Influencing ..:

, In: 2023 3rd International Conference on New Energy and Power Engineering (ICNEPE),
Sun, Tong ; Tian, Bowen ; Cai, Yumeng... - p. 454-461 , 2023
 
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8

Analytical models of the crosstalk voltage in SiC MOSFETs u..:

Xu, Hao ; Cai, Yumeng ; Sun, Peng..
IET Power Electronics.  16 (2023)  14 - p. 2356-2368 , 2023
 
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9

Characterization of Gate-Oxide Degradation Location for SiC..:

Cai, Yumeng ; Chen, Cong ; Zhao, Zhibin...
IEEE Transactions on Power Electronics.  38 (2023)  5 - p. 6081-6093 , 2023
 
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10

An Online Junction Temperature Monitoring Method for SiC MO..:

Guo, Yahui ; Sun, Peng ; Li, Huanlin..
Journal of Physics: Conference Series.  2520 (2023)  1 - p. 012043 , 2023
 
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11

Influencing Factors and Suppressing Methods of Current Imba..:

, In: 2022 IEEE 5th International Electrical and Energy Conference (CIEEC),
Qiao, Jianshen ; Zhao, Bin ; Sun, Peng.. - p. 4764-4769 , 2022
 
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12

Influence of Gate Resistance on Crosstalk of SiC MOSFETs:

, In: 2022 IEEE 5th International Electrical and Energy Conference (CIEEC),
Xu, Hao ; Cai, Yumeng ; Sun, Peng. - p. 4287-4292 , 2022
 
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13

Study on the Blocking Capability Decreasing of SiC MOSFET A..:

, In: Lecture Notes in Electrical Engineering; The proceedings of the 16th Annual Conference of China Electrotechnical Society,
Peng, Jiaoyang ; Sun, Peng ; Cai, Yumeng.. - p. 416-428 , 2022
 
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