E-LIB Suche - Ergebnisse für: Zagni, Nicolò

1

Hole Virtual Gate Model Explaining Surface-Related Dynamic ..:

Zagni, Nicolò ; Verzellesi, Giovanni ; Bertacchini, Alessandro...
IEEE Electron Device Letters. 45 (2024) 5 - p. 801-804 , 2024

Link: https://doi.org/10.1109/..

2

Correlating Interface and Border Traps With Distinctive Fea..:

Zagni, Nicolò ; Fregolent, Manuel ; Verzellesi, Giovanni...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1561-1566 , 2024

Link: https://doi.org/10.1109/..

3

On the Dynamic RON, Vertical Leakage and Capacitance Behavi..:

Cioni, Marcello ; Chini, Alessandro ; Zagni, Nicolò...
IEEE Electron Device Letters. 45 (2024) 8 - p. 1437-1440 , 2024

Link: https://doi.org/10.1109/..

4

From Planar to Vertical GaN-on-Si Power Devices: Reliabilit..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Zagni, Nicolo - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

5

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:

Zanoni, Enrico ; De Santi, Carlo ; Gao, Zhan...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1396-1407 , 2024

Link: https://doi.org/10.1109/..

6

Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-..:

Zagni, Nicolò ; Gao, Veronica Zhan ; Verzellesi, Giovanni...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 4 - p. 453-460 , 2023

Link: https://doi.org/10.1109/..

7

Reliability of HfO2-Based Ferroelectric FETs: A Critical Re..:

Zagni, Nicolo ; Puglisi, Francesco Maria ; Pavan, Paolo.
Proceedings of the IEEE. 111 (2023) 2 - p. 158-184 , 2023

Link: https://doi.org/10.1109/..

8

Unveiling the Role of Hole Barrier Traps on ON-Resistance I..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Zagni, Nicolo ; Chini, Alessandro ; Verzellesi, Giovanni... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

9

Gate-Bias Induced RON Instability in p-GaN Power HEMTs:

Chini, Alessandro ; Zagni, Nicolò ; Verzellesi, Giovanni...
IEEE Electron Device Letters. 44 (2023) 6 - p. 915-918 , 2023

Link: https://doi.org/10.1109/..

10

An Aqueous Route to Oxygen-Deficient Wake-Up-Free La-Doped ..:

Pujar, Pavan ; Cho, Haewon ; Kim, Young-Hoon...
ACS Nano. , 2023

Link: https://doi.org/10.1021/..

11

Negative Capacitors and Applications:

, In: Springer Handbook of Semiconductor Devices; Springer Handbooks,

Alam, Muhammad Ashraful ; Zagni, Nicolò ; Saha, Atanu Kumar... - p. 931-958 , 2022

Link: https://doi.org/10.1007/..

12

Fe-Traps Influence on Time-dependent Breakdown Voltage in 0..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Cioni, Marcello ; Zagni, Nicolo ; Chini, Alessandro - p. 11B.3-1-11B.3-5 , 2022

Link: https://doi.org/10.1109/..

13

Symmetrical VTH/RON Drifts Due to Negative/Positive Gate St..:

, In: 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),

Zagni, Nicolo ; Cioni, Marcello ; Castagna, Maria Eloisa... - p. 31-34 , 2022

Link: https://doi.org/10.1109/..

14

Temperature-Independent Current Dispersion in 0.15 μm AlGaN..:

Zagni, Nicolò ; Verzellesi, Giovanni ; Chini, Alessandro
Micromachines. 13 (2022) 12 - p. 2244 , 2022

Link: https://doi.org/10.3390/..

15

A Novel Temperature Estimation Technique Exploiting Carrier..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),

Cioni, Marcello ; Zagni, Nicolo ; Chini, Alessandro - p. 372-375 , 2022

Link: https://doi.org/10.1109/..