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Zaka, Alban
15  Ergebnisse:
Personensuche X
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1

Modeling Methodology for Thermal Stability Factor in Spin T..:

Talapatra, Abhishek ; Weisheit, Martin ; Müller, Johannes...
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1886-1892 , 2024
Link: https://doi.org/10.1109/..
 
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2

Efficient Characterization Methodology for Low-Frequency No..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Pirro, Luca ; Chohan, Talha ; Liebscher, Philipp... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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3

Enabling medium thick gate oxide devices in 22FDX® technolo..:

Herrmann, Tom ; Zaka, Alban ; Zhao, Zhixing...
Solid-State Electronics.  199 (2023)  - p. 108512 , 2023
Link: https://doi.org/10.1016/..
 
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4

Novel Hybrid SiGe-Silicon 5V pLDMOS on 28nm HKMG technology:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Jain, Ruchil ; Holzmueller, Felix ; Baars, Peter... - p. 13-16 , 2022
Link: https://doi.org/10.1109/..
 
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5

Design Optimization of MV-NMOS for ESD Self-protection in 2..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Hwang, Kyongjin ; Karalkar, Sagar Premnath ; Ganesan, Vishal... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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6

TCAD Modeling and Optimization of 28nm HKMG ESF3 Flash Memo..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Zaka, Alban ; Herrmann, Tom ; Richter, Ralf.. - p. 169-172 , 2020
Link: https://doi.org/10.23919..
 
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7

RF performance improvement on 22FDX® platform and beyond:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Herrmann, Tom ; Zaka, Alban ; Subramani, Nandha Kumar... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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8

Investigation of advanced FDSOI CMOS devices for analog/mix..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Seiler, Tim ; Juttner, Maximilian ; Herrmann, Tom... - p. 1-3 , 2019
Link: https://doi.org/10.1109/..
 
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9

Investigation of Embedded SiGe Source/Drain for 28nm HKMG P..:

Bazizi, El Mehdi ; Zaka, Alban ; Dilliway, Gabriela...
ECS Transactions.  53 (2013)  3 - p. 27-32 , 2013
Link: https://doi.org/10.1149/..
 
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10

Analysis of defect capture cross sections using non-radiati..:

Garetto, Davide ; Randriamihaja, Yoann Mamy ; Zaka, Alban...
Solid-State Electronics.  71 (2012)  - p. 74-79 , 2012
Link: https://doi.org/10.1016/..
 
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11

On the accuracy of current TCAD hot carrier injection model..:

Zaka, Alban ; Rafhay, Quentin ; Iellina, Matteo...
Solid-State Electronics.  54 (2010)  12 - p. 1669-1674 , 2010
Link: https://doi.org/10.1016/..
 
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12

Carrier injection and degradation mechanisms in advanced NO..:

Zaka, Alban
http://www.theses.fr/2012GRENT118/document.  , 2012
Link: http://www.theses.fr/201..
 
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13

Carrier injection and degradation mechanisms in advanced NO..:

Zaka, Alban
NNT: 2012GRENT118.  , 2012
Link: https://theses.hal.scien..
 
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14

Carrier injection and degradation mechanisms in advanced NO..:

Zaka, Alban
NNT: 2012GRENT118.  , 2012
Link: https://tel.archives-ouv..
 
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15

Carrier injection and degradation mechanisms in advanced NO..:

Zaka, Alban
NNT: 2012GRENT118.  , 2012
Link: https://theses.hal.scien..
 
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