Zandiatashbar, Ardavan
8  Ergebnisse:
Personensuche X
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1

In-line metrology for atomic resolution local height variat..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Kim, Tae-Gon ; Kim, Soon-Wook ; Vanderwayer, Tom... - p. 267-272 , 2017
 
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7

Graphene Nanoribbon Composites:

Rafiee, Mohammad A. ; Lu, Wei ; Thomas, Abhay V....
ACS Nano.  4 (2010)  12 - p. 7415-7420 , 2010
 
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