Zechner, CHRISTOPH
254  Ergebnisse:
Personensuche X
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Accurate and efficient 3D analytic ion implantation model b..:

Terterian, Arsen ; Zographos, Nikolas ; Tian, Shiyang..
Materials Science in Semiconductor Processing.  169 (2024)  - p. 107933 , 2024
 
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First-Principles Study of Charged Point Defects in 4H-SiC: ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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