Zeile, U.
12  Ergebnisse:
Personensuche X
?
1

Advantages of a Local Charge Compensation System for FIB/SE..:

Schulz, H ; Zeile, U ; Stodolka, JP.
Microscopy and Microanalysis.  15 (2009)  S2 - p. 332-333 , 2009
 
?
3

Looking Into van Gogh¡¦s Paintings with Focused Ion Beam (F..:

Zeile, U ; Haswell, R
Microscopy and Microanalysis.  12 (2006)  S02 - p. 1256-1257 , 2006
 
?
4

Real time SEM imaging of FIB milling processes for extended..:

Gnauck, P. ; Zeile, U. ; Rau, W..
Microscopy and Microanalysis.  9 (2003)  S03 - p. 524-525 , 2003
 
?
5

Focused Ion Beam Preparation Techniques for EFTEM Analysis:

Gnauck, P. ; Zeile, U. ; Benner, G...
Microscopy and Microanalysis.  9 (2003)  S02 - p. 872-873 , 2003
 
?
6

Development of an Ion Optical System to transfer Secondary ..:

B, Schröppel ; E, Plies ; C, Burkhardt...
Microscopy and Microanalysis.  13 (2007)  S03 - p. 16-17 , 2007
 
?
8

Identification of the primary tumour with the help of diffu..:

Zeile, M ; Andreou, D ; Poellinger, A..
The British Journal of Radiology.  84 (2011)  1003 - p. e142-e145 , 2011
 
?
9

Ultrasonic Investigation of the Acceptor Ground State of Si..:

Zeile, H. ; Harten, U. ; Lassmann, K.
physica status solidi (b).  111 (1982)  1 - p. 213-220 , 1982
 
?
10

Identification of the primary tumour with the help of diffu..:

Zeile, M ; Andreou, D ; Poellinger, A..
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC3473486.  , 2011
 
1-12